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Translation of automotive module RF immunity test limits into equivalent IC test limits using S-parameter IC models

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Abstract
A method to translate immunity specifications of automotive modules into equivalent requirements at integrated circuit (IC) level, using linear scattering parameter models of the ICs, is presented. A technique is described to determine S-parameters of ICs by simulations based on back-annotated analog schematics. The simulation results are compared with measurement data obtained using a specially designed test board. As an example, simulation and measurement results are given for the input stage of an automotive sensor interface. A good agreement is obtained from the lowest test frequency up to 1 GHz. Above this value, the measured results seem to be dominated by package effects.
Keywords
S-parameters, INTEGRATED-CIRCUITS, direct power injection (DPI), RE immunity, automotive EMC

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Citation

Please use this url to cite or link to this publication:

MLA
Pues, Hugo et al. “Translation of Automotive Module RF Immunity Test Limits into Equivalent IC Test Limits Using S-parameter IC Models.” 9th International Workshop on Electromagnetic Compatibility of Integrated Circuits. New York, NY, USA: IEEE, 2013. 249–253. Print.
APA
Pues, H., Briké, B., Gazda, C., Teichmann, P., Stijnen, K., Peeters, C., Durier, A., et al. (2013). Translation of automotive module RF immunity test limits into equivalent IC test limits using S-parameter IC models. 9th International Workshop on Electromagnetic Compatibility of Integrated Circuits (pp. 249–253). Presented at the 9th International Workshop on Electromagnetic Compatibility of Integrated Circuits (EMC Compo 2013), New York, NY, USA: IEEE.
Chicago author-date
Pues, Hugo, Ben Briké, Celina Gazda, Peter Teichmann, Kristof Stijnen, Christian Peeters, André Durier, and Dries Vande Ginste. 2013. “Translation of Automotive Module RF Immunity Test Limits into Equivalent IC Test Limits Using S-parameter IC Models.” In 9th International Workshop on Electromagnetic Compatibility of Integrated Circuits, 249–253. New York, NY, USA: IEEE.
Chicago author-date (all authors)
Pues, Hugo, Ben Briké, Celina Gazda, Peter Teichmann, Kristof Stijnen, Christian Peeters, André Durier, and Dries Vande Ginste. 2013. “Translation of Automotive Module RF Immunity Test Limits into Equivalent IC Test Limits Using S-parameter IC Models.” In 9th International Workshop on Electromagnetic Compatibility of Integrated Circuits, 249–253. New York, NY, USA: IEEE.
Vancouver
1.
Pues H, Briké B, Gazda C, Teichmann P, Stijnen K, Peeters C, et al. Translation of automotive module RF immunity test limits into equivalent IC test limits using S-parameter IC models. 9th International Workshop on Electromagnetic Compatibility of Integrated Circuits. New York, NY, USA: IEEE; 2013. p. 249–53.
IEEE
[1]
H. Pues et al., “Translation of automotive module RF immunity test limits into equivalent IC test limits using S-parameter IC models,” in 9th International Workshop on Electromagnetic Compatibility of Integrated Circuits, Nara, Japan, 2013, pp. 249–253.
@inproceedings{4422616,
  abstract     = {A method to translate immunity specifications of automotive modules into equivalent requirements at integrated circuit (IC) level, using linear scattering parameter models of the ICs, is presented. A technique is described to determine S-parameters of ICs by simulations based on back-annotated analog schematics. The simulation results are compared with measurement data obtained using a specially designed test board. As an example, simulation and measurement results are given for the input stage of an automotive sensor interface. A good agreement is obtained from the lowest test frequency up to 1 GHz. Above this value, the measured results seem to be dominated by package effects.},
  author       = {Pues, Hugo and Briké, Ben and Gazda, Celina and Teichmann, Peter and Stijnen, Kristof and Peeters, Christian and Durier, André and Vande Ginste, Dries},
  booktitle    = {9th International Workshop on Electromagnetic Compatibility of Integrated Circuits},
  isbn         = {9781479923151},
  keywords     = {S-parameters,INTEGRATED-CIRCUITS,direct power injection (DPI),RE immunity,automotive EMC},
  language     = {eng},
  location     = {Nara, Japan},
  pages        = {249--253},
  publisher    = {IEEE},
  title        = {Translation of automotive module RF immunity test limits into equivalent IC test limits using S-parameter IC models},
  year         = {2013},
}

Web of Science
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