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In situ characterization of atomic layer deposition in mesoporous thin films by grazing incidence small angle x-ray scattering

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Chicago
Dendooven, Jolien, Kilian Devloo-Casier, Matthias Ide, Kathryn Grandfield, Karl Ludwig, Pascal Van Der Voort, Sara Bals, and Christophe Detavernier. 2013. “In Situ Characterization of Atomic Layer Deposition in Mesoporous Thin Films by Grazing Incidence Small Angle X-ray Scattering.” In Synchrotron and Neutron Workshop, Abstracts.
APA
Dendooven, J., Devloo-Casier, K., Ide, M., Grandfield, K., Ludwig, K., Van Der Voort, P., Bals, S., et al. (2013). In situ characterization of atomic layer deposition in mesoporous thin films by grazing incidence small angle x-ray scattering. Synchrotron and Neutron Workshop, Abstracts. Presented at the Synchrotron and Neutron Workshop 2013 (SYNEW 2013).
Vancouver
1.
Dendooven J, Devloo-Casier K, Ide M, Grandfield K, Ludwig K, Van Der Voort P, et al. In situ characterization of atomic layer deposition in mesoporous thin films by grazing incidence small angle x-ray scattering. Synchrotron and Neutron Workshop, Abstracts. 2013.
MLA
Dendooven, Jolien, Kilian Devloo-Casier, Matthias Ide, et al. “In Situ Characterization of Atomic Layer Deposition in Mesoporous Thin Films by Grazing Incidence Small Angle X-ray Scattering.” Synchrotron and Neutron Workshop, Abstracts. 2013. Print.
@inproceedings{4360856,
  author       = {Dendooven, Jolien and Devloo-Casier, Kilian and Ide, Matthias and Grandfield, Kathryn and Ludwig, Karl and Van Der Voort, Pascal and Bals, Sara and Detavernier, Christophe},
  booktitle    = {Synchrotron and Neutron Workshop, Abstracts},
  language     = {eng},
  location     = {Antwerp, Belgium},
  title        = {In situ characterization of atomic layer deposition in mesoporous thin films by grazing incidence small angle x-ray scattering},
  year         = {2013},
}