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Adaptive classification algorithm for EMC-compliance testing of electronic devices

Prashant Singh (UGent) , Dirk Deschrijver (UGent) , D. Pissoort and Tom Dhaene (UGent)
(2013) ELECTRONICS LETTERS. 49(24). p.1526-1527
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Abstract
A novel technique that facilitates near-field (NF) scanning for electromagnetic compatibility-compliance testing is described. It performs measurements in a sequential way with the aim of discovering multiple, possibly disjoint regions where the amplitudes of an NF component belong to certain output ranges. The measured data samples are used to train a classification model where each NF range is represented by a given class (e.g. low/medium/high NF amplitudes). The outcome of the algorithm is a visual map that clearly characterises and pinpoints the exact location and boundaries of each class. Such maps are useful, for example, to detect hotspots or regions that are prone to electromagnetic compatibility issues. The technique has been validated on a measured microstrip bend discontinuity.
Keywords
electron device testing, electromagnetic compatibility, adaptive classification algorithm, EMC-compliance testing, electronic devices, electromagnetic compatibility-compliance testing, disjoint regions, hotspot detection, microstrip bend discontinuity, DESIGN, IBCN

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Citation

Please use this url to cite or link to this publication:

Chicago
Singh, Prashant, Dirk Deschrijver, D. Pissoort, and Tom Dhaene. 2013. “Adaptive Classification Algorithm for EMC-compliance Testing of Electronic Devices.” Electronics Letters 49 (24): 1526–1527.
APA
Singh, Prashant, Deschrijver, D., Pissoort, D., & Dhaene, T. (2013). Adaptive classification algorithm for EMC-compliance testing of electronic devices. ELECTRONICS LETTERS, 49(24), 1526–1527.
Vancouver
1.
Singh P, Deschrijver D, Pissoort D, Dhaene T. Adaptive classification algorithm for EMC-compliance testing of electronic devices. ELECTRONICS LETTERS. 2013;49(24):1526–7.
MLA
Singh, Prashant, Dirk Deschrijver, D. Pissoort, et al. “Adaptive Classification Algorithm for EMC-compliance Testing of Electronic Devices.” ELECTRONICS LETTERS 49.24 (2013): 1526–1527. Print.
@article{4315811,
  abstract     = {A novel technique that facilitates near-field (NF) scanning for electromagnetic compatibility-compliance testing is described. It performs measurements in a sequential way with the aim of discovering multiple, possibly disjoint regions where the amplitudes of an NF component belong to certain output ranges. The measured data samples are used to train a classification model where each NF range is represented by a given class (e.g. low/medium/high NF amplitudes). The outcome of the algorithm is a visual map that clearly characterises and pinpoints the exact location and boundaries of each class. Such maps are useful, for example, to detect hotspots or regions that are prone to electromagnetic compatibility issues. The technique has been validated on a measured microstrip bend discontinuity.},
  author       = {Singh, Prashant and Deschrijver, Dirk and Pissoort, D. and Dhaene, Tom},
  issn         = {0013-5194},
  journal      = {ELECTRONICS LETTERS},
  language     = {eng},
  number       = {24},
  pages        = {1526--1527},
  title        = {Adaptive classification algorithm for EMC-compliance testing of electronic devices},
  url          = {http://dx.doi.org/10.1049/el.2013.2766},
  volume       = {49},
  year         = {2013},
}

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