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Integrated study of high resolution CT and XRF applied to natural building stones: preliminary results

Jan Dewanckele (UGent) , Veerle Cnudde (UGent) , Yoni De Witte (UGent) , Matthieu Boone (UGent) , Denis Van Loo (UGent) , B Schouenborg, Luc Van Hoorebeke (UGent) and Patric Jacobs (UGent)
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Please use this url to cite or link to this publication:

MLA
Dewanckele, Jan, Veerle Cnudde, Yoni De Witte, et al. “Integrated Study of High Resolution CT and XRF Applied to Natural Building Stones: Preliminary Results.” Book of Abstracts : 9th International Conference on X‐ray Microscopy. 2008. 87–87. Print.
APA
Dewanckele, J., Cnudde, V., De Witte, Y., Boone, M., Van Loo, D., Schouenborg, B., Van Hoorebeke, L., et al. (2008). Integrated study of high resolution CT and XRF applied to natural building stones: preliminary results. Book of abstracts : 9th international conference on X‐ray microscopy (pp. 87–87). Presented at the 9th International conference on X‐Ray Microscopy (XRM 2008).
Chicago author-date
Dewanckele, Jan, Veerle Cnudde, Yoni De Witte, Matthieu Boone, Denis Van Loo, B Schouenborg, Luc Van Hoorebeke, and Patric Jacobs. 2008. “Integrated Study of High Resolution CT and XRF Applied to Natural Building Stones: Preliminary Results.” In Book of Abstracts : 9th International Conference on X‐ray Microscopy, 87–87.
Chicago author-date (all authors)
Dewanckele, Jan, Veerle Cnudde, Yoni De Witte, Matthieu Boone, Denis Van Loo, B Schouenborg, Luc Van Hoorebeke, and Patric Jacobs. 2008. “Integrated Study of High Resolution CT and XRF Applied to Natural Building Stones: Preliminary Results.” In Book of Abstracts : 9th International Conference on X‐ray Microscopy, 87–87.
Vancouver
1.
Dewanckele J, Cnudde V, De Witte Y, Boone M, Van Loo D, Schouenborg B, et al. Integrated study of high resolution CT and XRF applied to natural building stones: preliminary results. Book of abstracts : 9th international conference on X‐ray microscopy. 2008. p. 87–87.
IEEE
[1]
J. Dewanckele et al., “Integrated study of high resolution CT and XRF applied to natural building stones: preliminary results,” in Book of abstracts : 9th international conference on X‐ray microscopy, Zürich, Switzerland, 2008, pp. 87–87.
@inproceedings{430524,
  author       = {Dewanckele, Jan and Cnudde, Veerle and De Witte, Yoni and Boone, Matthieu and Van Loo, Denis and Schouenborg, B and Van Hoorebeke, Luc and Jacobs, Patric},
  booktitle    = {Book of abstracts : 9th international conference on X‐ray microscopy},
  language     = {eng},
  location     = {Zürich, Switzerland},
  pages        = {87--87},
  title        = {Integrated study of high resolution CT and XRF applied to natural building stones: preliminary results},
  year         = {2008},
}