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Properties of shallowly etched second order grating in silicon-on-insulator (SOI) waveguide

Lianyan Li (UGent) , Yanlu Li (UGent) and Geert Morthier (UGent)
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Center for nano- and biophotonics (NB-Photonics)

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Citation

Please use this url to cite or link to this publication:

Chicago
Li, Lianyan, Yanlu Li, and Geert Morthier. 2013. “Properties of Shallowly Etched Second Order Grating in Silicon-on-insulator (SOI) Waveguide.” In IEEE Photonics Benelux Annual Workshop 2013, Abstracts.
APA
Li, Lianyan, Li, Y., & Morthier, G. (2013). Properties of shallowly etched second order grating in silicon-on-insulator (SOI) waveguide. IEEE Photonics Benelux Annual Workshop 2013, Abstracts. Presented at the IEEE Photonics Benelux Annual Workshop 2013.
Vancouver
1.
Li L, Li Y, Morthier G. Properties of shallowly etched second order grating in silicon-on-insulator (SOI) waveguide. IEEE Photonics Benelux Annual Workshop 2013, Abstracts. 2013.
MLA
Li, Lianyan, Yanlu Li, and Geert Morthier. “Properties of Shallowly Etched Second Order Grating in Silicon-on-insulator (SOI) Waveguide.” IEEE Photonics Benelux Annual Workshop 2013, Abstracts. 2013. Print.
@inproceedings{4249609,
  author       = {Li, Lianyan and Li, Yanlu and Morthier, Geert},
  booktitle    = {IEEE Photonics Benelux Annual Workshop 2013, Abstracts},
  language     = {eng},
  location     = {Brussels, Belgium},
  pages        = {2},
  title        = {Properties of shallowly etched second order grating in silicon-on-insulator (SOI) waveguide},
  year         = {2013},
}