SPICE-based statistical assessment of interconnects terminated by nonlinear loads with polynomial characteristics
- Author
- Paolo Manfredi, Alessandro Biondi (UGent) , Dries Vande Ginste (UGent) , Daniël De Zutter (UGent) and Flavio Canavero
- Organization
- Abstract
- This paper proposes an exact formalism for the inclusion of nonlinear elements with polynomial I-V characteristic into the polynomial chaos framework for statistical circuit simulation, which was so far limited to linear circuits. The formulation is SPICE-compatible, thus allowing the convenient integration of such nonlinear elements into standard circuit solvers. This contribution represents a considerable step forward towards the inclusion of nonlinear terminations into the SPICE-and polynomial chaos-based statistical analysis of interconnects with stochastic parameters. The theory is illustrated and validated by means of an application example.
- Keywords
- circuit simulation, Circuit modeling, nonlinear, polynomial chaos, stochastic analysis, transmission lines, uncertainty, DESIGN
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Citation
Please use this url to cite or link to this publication: http://hdl.handle.net/1854/LU-4248986
- MLA
- Manfredi, Paolo, et al. “SPICE-Based Statistical Assessment of Interconnects Terminated by Nonlinear Loads with Polynomial Characteristics.” IEEE Conference on Electrical Performance of Electronic Packaging and Systems-EPEPS, IEEE, 2013, pp. 99–102.
- APA
- Manfredi, P., Biondi, A., Vande Ginste, D., De Zutter, D., & Canavero, F. (2013). SPICE-based statistical assessment of interconnects terminated by nonlinear loads with polynomial characteristics. IEEE Conference on Electrical Performance of Electronic Packaging and Systems-EPEPS, 99–102. IEEE.
- Chicago author-date
- Manfredi, Paolo, Alessandro Biondi, Dries Vande Ginste, Daniël De Zutter, and Flavio Canavero. 2013. “SPICE-Based Statistical Assessment of Interconnects Terminated by Nonlinear Loads with Polynomial Characteristics.” In IEEE Conference on Electrical Performance of Electronic Packaging and Systems-EPEPS, 99–102. IEEE.
- Chicago author-date (all authors)
- Manfredi, Paolo, Alessandro Biondi, Dries Vande Ginste, Daniël De Zutter, and Flavio Canavero. 2013. “SPICE-Based Statistical Assessment of Interconnects Terminated by Nonlinear Loads with Polynomial Characteristics.” In IEEE Conference on Electrical Performance of Electronic Packaging and Systems-EPEPS, 99–102. IEEE.
- Vancouver
- 1.Manfredi P, Biondi A, Vande Ginste D, De Zutter D, Canavero F. SPICE-based statistical assessment of interconnects terminated by nonlinear loads with polynomial characteristics. In: IEEE Conference on Electrical Performance of Electronic Packaging and Systems-EPEPS. IEEE; 2013. p. 99–102.
- IEEE
- [1]P. Manfredi, A. Biondi, D. Vande Ginste, D. De Zutter, and F. Canavero, “SPICE-based statistical assessment of interconnects terminated by nonlinear loads with polynomial characteristics,” in IEEE Conference on Electrical Performance of Electronic Packaging and Systems-EPEPS, San Jose, California, USA, 2013, pp. 99–102.
@inproceedings{4248986, abstract = {{This paper proposes an exact formalism for the inclusion of nonlinear elements with polynomial I-V characteristic into the polynomial chaos framework for statistical circuit simulation, which was so far limited to linear circuits. The formulation is SPICE-compatible, thus allowing the convenient integration of such nonlinear elements into standard circuit solvers. This contribution represents a considerable step forward towards the inclusion of nonlinear terminations into the SPICE-and polynomial chaos-based statistical analysis of interconnects with stochastic parameters. The theory is illustrated and validated by means of an application example.}}, author = {{Manfredi, Paolo and Biondi, Alessandro and Vande Ginste, Dries and De Zutter, Daniël and Canavero, Flavio}}, booktitle = {{IEEE Conference on Electrical Performance of Electronic Packaging and Systems-EPEPS}}, isbn = {{9781479907076}}, issn = {{2165-4107}}, keywords = {{circuit simulation,Circuit modeling,nonlinear,polynomial chaos,stochastic analysis,transmission lines,uncertainty,DESIGN}}, language = {{eng}}, location = {{San Jose, California, USA}}, pages = {{99--102}}, publisher = {{IEEE}}, title = {{SPICE-based statistical assessment of interconnects terminated by nonlinear loads with polynomial characteristics}}, year = {{2013}}, }