Ultra-thin multi-axial shear stress sensor based on a segmented photodiode
- Author
- Jeroen Missinne (UGent) , Plamen Kostov, Bram Van Hoe (UGent) , Erwin Bosman (UGent) , Wolfgang Gaberl, Horst Zimmermann and Geert Van Steenberge (UGent)
- Organization
- Abstract
- Several applications require detecting shear stress, associated with slippage or friction events. This paper describes the results of an optoelectronics based shear stress sensor using a segmented photodiode embedded in ultra-thin polymer layers.
- Keywords
- optical, flexible, shear sensor, multi-axial, CMOS photodiode
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Citation
Please use this url to cite or link to this publication: http://hdl.handle.net/1854/LU-4207517
- MLA
- Missinne, Jeroen, et al. “Ultra-Thin Multi-Axial Shear Stress Sensor Based on a Segmented Photodiode.” IEEE Photonics Conference, IEEE, Piscataway, NJ, USA, 2013, pp. 606–07, doi:10.1109/IPCon.2013.6656440.
- APA
- Missinne, J., Kostov, P., Van Hoe, B., Bosman, E., Gaberl, W., Zimmermann, H., & Van Steenberge, G. (2013). Ultra-thin multi-axial shear stress sensor based on a segmented photodiode. IEEE Photonics Conference, 606–607. https://doi.org/10.1109/IPCon.2013.6656440
- Chicago author-date
- Missinne, Jeroen, Plamen Kostov, Bram Van Hoe, Erwin Bosman, Wolfgang Gaberl, Horst Zimmermann, and Geert Van Steenberge. 2013. “Ultra-Thin Multi-Axial Shear Stress Sensor Based on a Segmented Photodiode.” In IEEE Photonics Conference, 606–7. IEEE, Piscataway, NJ, USA. https://doi.org/10.1109/IPCon.2013.6656440.
- Chicago author-date (all authors)
- Missinne, Jeroen, Plamen Kostov, Bram Van Hoe, Erwin Bosman, Wolfgang Gaberl, Horst Zimmermann, and Geert Van Steenberge. 2013. “Ultra-Thin Multi-Axial Shear Stress Sensor Based on a Segmented Photodiode.” In IEEE Photonics Conference, 606–607. IEEE, Piscataway, NJ, USA. doi:10.1109/IPCon.2013.6656440.
- Vancouver
- 1.Missinne J, Kostov P, Van Hoe B, Bosman E, Gaberl W, Zimmermann H, et al. Ultra-thin multi-axial shear stress sensor based on a segmented photodiode. In: IEEE Photonics Conference. IEEE, Piscataway, NJ, USA; 2013. p. 606–7.
- IEEE
- [1]J. Missinne et al., “Ultra-thin multi-axial shear stress sensor based on a segmented photodiode,” in IEEE Photonics Conference, Bellevue, WA, USA, 2013, pp. 606–607.
@inproceedings{4207517, abstract = {{Several applications require detecting shear stress, associated with slippage or friction events. This paper describes the results of an optoelectronics based shear stress sensor using a segmented photodiode embedded in ultra-thin polymer layers.}}, author = {{Missinne, Jeroen and Kostov, Plamen and Van Hoe, Bram and Bosman, Erwin and Gaberl, Wolfgang and Zimmermann, Horst and Van Steenberge, Geert}}, booktitle = {{IEEE Photonics Conference}}, isbn = {{978-1-4577-1507-5}}, issn = {{2374-0140}}, keywords = {{optical,flexible,shear sensor,multi-axial,CMOS photodiode}}, language = {{eng}}, location = {{Bellevue, WA, USA}}, pages = {{606--607}}, publisher = {{IEEE, Piscataway, NJ, USA}}, title = {{Ultra-thin multi-axial shear stress sensor based on a segmented photodiode}}, url = {{http://doi.org/10.1109/IPCon.2013.6656440}}, year = {{2013}}, }
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