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Variability analysis of interconnects terminated by general nonlinear loads

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Abstract
In this paper, a stochastic modeling method is presented for the analysis of variability effects, induced by the manufacturing process, on interconnect structures terminated by general nonlinear loads. The technique is based on the solution of the pertinent stochastic Telegrapher's equations in time domain by means of the well-established stochastic Galerkin method, but now allows, for the first time in the literature, the inclusion of loads with arbitrary I-V characteristics at the terminals of the lines. The transient solution is obtained by combining the stochastic Galerkin method with a finite-difference time-domain scheme. The proposed technique is validated and illustrated with a meaningful application example, demonstrating its accuracy and efficiency.
Keywords
PARAMETERS, OPTIMIZATION, STATISTICAL DESIGN, HERMITE POLYNOMIAL CHAOS, Finite-difference time-domain, multiconductor transmission line, nonlinear, polynomial chaos, stochastic Galerkin method, uncertainty, variability analysis

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Citation

Please use this url to cite or link to this publication:

Chicago
Biondi, Alessandro, Dries Vande Ginste, Daniël De Zutter, Paolo Manfredi, and Flavio Canavero. 2013. “Variability Analysis of Interconnects Terminated by General Nonlinear Loads.” Ieee Transactions on Components Packaging and Manufacturing Technology 3 (7): 1244–1251.
APA
Biondi, Alessandro, Vande Ginste, D., De Zutter, D., Manfredi, P., & Canavero, F. (2013). Variability analysis of interconnects terminated by general nonlinear loads. IEEE TRANSACTIONS ON COMPONENTS PACKAGING AND MANUFACTURING TECHNOLOGY, 3(7), 1244–1251.
Vancouver
1.
Biondi A, Vande Ginste D, De Zutter D, Manfredi P, Canavero F. Variability analysis of interconnects terminated by general nonlinear loads. IEEE TRANSACTIONS ON COMPONENTS PACKAGING AND MANUFACTURING TECHNOLOGY. IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC; 2013;3(7):1244–51.
MLA
Biondi, Alessandro, Dries Vande Ginste, Daniël De Zutter, et al. “Variability Analysis of Interconnects Terminated by General Nonlinear Loads.” IEEE TRANSACTIONS ON COMPONENTS PACKAGING AND MANUFACTURING TECHNOLOGY 3.7 (2013): 1244–1251. Print.
@article{4188806,
  abstract     = {In this paper, a stochastic modeling method is presented for the analysis of variability effects, induced by the manufacturing process, on interconnect structures terminated by general nonlinear loads. The technique is based on the solution of the pertinent stochastic Telegrapher's equations in time domain by means of the well-established stochastic Galerkin method, but now allows, for the first time in the literature, the inclusion of loads with arbitrary I-V characteristics at the terminals of the lines. The transient solution is obtained by combining the stochastic Galerkin method with a finite-difference time-domain scheme. The proposed technique is validated and illustrated with a meaningful application example, demonstrating its accuracy and efficiency.},
  author       = {Biondi, Alessandro and Vande Ginste, Dries and De Zutter, Dani{\"e}l and Manfredi, Paolo and Canavero, Flavio},
  issn         = {2156-3950},
  journal      = {IEEE TRANSACTIONS ON COMPONENTS PACKAGING AND MANUFACTURING TECHNOLOGY},
  language     = {eng},
  number       = {7},
  pages        = {1244--1251},
  publisher    = {IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC},
  title        = {Variability analysis of interconnects terminated by general nonlinear loads},
  url          = {http://dx.doi.org/10.1109/TCPMT.2013.2259896},
  volume       = {3},
  year         = {2013},
}

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