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Accurate characterization of some radiative EMC phenomena at chip level, using dedicated EMC-testchips.

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Chicago
Criel, Steven, F BONJEAN, R DE SMEDT, Jan De Moerloose, Luc Martens, Femke Olyslager, and Daniël De Zutter. 1998. “Accurate Characterization of Some Radiative EMC Phenomena at Chip Level, Using Dedicated EMC-testchips.” 1998 IEEE INTERNATIONAL SYMPOSIUM ON ELECTROMAGNETIC COMPATIBILITY - SYMPOSIUM RECORD, VOLS 1 AND 2: 734–738.
APA
Criel, S., BONJEAN, F., DE SMEDT, R., De Moerloose, J., Martens, L., Olyslager, F., & De Zutter, D. (1998). Accurate characterization of some radiative EMC phenomena at chip level, using dedicated EMC-testchips. 1998 IEEE INTERNATIONAL SYMPOSIUM ON ELECTROMAGNETIC COMPATIBILITY - SYMPOSIUM RECORD, VOLS 1 AND 2, 734–738.
Vancouver
1.
Criel S, BONJEAN F, DE SMEDT R, De Moerloose J, Martens L, Olyslager F, et al. Accurate characterization of some radiative EMC phenomena at chip level, using dedicated EMC-testchips. 1998 IEEE INTERNATIONAL SYMPOSIUM ON ELECTROMAGNETIC COMPATIBILITY - SYMPOSIUM RECORD, VOLS 1 AND 2. 1998;734–8.
MLA
Criel, Steven, F BONJEAN, R DE SMEDT, et al. “Accurate Characterization of Some Radiative EMC Phenomena at Chip Level, Using Dedicated EMC-testchips.” 1998 IEEE INTERNATIONAL SYMPOSIUM ON ELECTROMAGNETIC COMPATIBILITY - SYMPOSIUM RECORD, VOLS 1 AND 2 (1998): 734–738. Print.
@article{408980,
  author       = {Criel, Steven and BONJEAN, F and DE SMEDT, R and De Moerloose, Jan and Martens, Luc and Olyslager, Femke and De Zutter, Dani{\"e}l},
  journal      = {1998 IEEE INTERNATIONAL SYMPOSIUM ON ELECTROMAGNETIC COMPATIBILITY - SYMPOSIUM RECORD, VOLS 1 AND 2},
  language     = {eng},
  pages        = {734--738},
  title        = {Accurate characterization of some radiative EMC phenomena at chip level, using dedicated EMC-testchips.},
  year         = {1998},
}

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