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Axiotaxy of CrSi/sub 2/ on Si(001); from the micrometer- to the angstrom-scale

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Chicago
FALKE, M., H. SCHLETTER, O. FILONENKO, A. MOGILATENKO, G. BEDDIES, S. SCHULZE, M. HIETSCHOLD, A. BLELOCH, Koen De Keyser, and Christophe Detavernier. 2007. “Axiotaxy of CrSi/sub 2/ on Si(001); from the Micrometer- to the Angstrom-scale.” In Proceedings. Microscopy Conference 2007, 396–397.
APA
FALKE, M., SCHLETTER, H., FILONENKO, O., MOGILATENKO, A., BEDDIES, G., SCHULZE, S., HIETSCHOLD, M., et al. (2007). Axiotaxy of CrSi/sub 2/ on Si(001); from the micrometer- to the angstrom-scale. Proceedings. Microscopy Conference 2007 (pp. 396–397).
Vancouver
1.
FALKE M, SCHLETTER H, FILONENKO O, MOGILATENKO A, BEDDIES G, SCHULZE S, et al. Axiotaxy of CrSi/sub 2/ on Si(001); from the micrometer- to the angstrom-scale. Proceedings. Microscopy Conference 2007. 2007. p. 396–7.
MLA
FALKE, M., H. SCHLETTER, O. FILONENKO, et al. “Axiotaxy of CrSi/sub 2/ on Si(001); from the Micrometer- to the Angstrom-scale.” Proceedings. Microscopy Conference 2007. 2007. 396–397. Print.
@inproceedings{408867,
  author       = {FALKE, M. and SCHLETTER, H. and FILONENKO, O. and MOGILATENKO, A. and BEDDIES, G. and SCHULZE, S. and HIETSCHOLD, M. and BLELOCH, A. and De Keyser, Koen and Detavernier, Christophe},
  booktitle    = {Proceedings. Microscopy Conference 2007},
  language     = {eng},
  pages        = {396--397},
  title        = {Axiotaxy of CrSi/sub 2/ on Si(001); from the micrometer- to the angstrom-scale},
  year         = {2007},
}

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