Advanced search
2 files | 2.62 MB Add to list

Efficient measurement procedure for hotspot detection in near-field pattern of electronic devices

Prashant Singh (UGent) , Dirk Deschrijver (UGent) , Davy Pissoort and Tom Dhaene (UGent)
Author
Organization
Keywords
IBCN

Downloads

  • (...).pdf
    • full text
    • |
    • UGent only
    • |
    • PDF
    • |
    • 1.33 MB
  • 5612 i.pdf
    • full text
    • |
    • open access
    • |
    • PDF
    • |
    • 1.28 MB

Citation

Please use this url to cite or link to this publication:

MLA
Singh, Prashant et al. “Efficient Measurement Procedure for Hotspot Detection in Near-field Pattern of Electronic Devices.” BESTCOM Meeting, Abstracts. 2013. Print.
APA
Singh, Prashant, Deschrijver, D., Pissoort, D., & Dhaene, T. (2013). Efficient measurement procedure for hotspot detection in near-field pattern of electronic devices. BESTCOM Meeting, Abstracts. Presented at the BESTCOM Meeting.
Chicago author-date
Singh, Prashant, Dirk Deschrijver, Davy Pissoort, and Tom Dhaene. 2013. “Efficient Measurement Procedure for Hotspot Detection in Near-field Pattern of Electronic Devices.” In BESTCOM Meeting, Abstracts.
Chicago author-date (all authors)
Singh, Prashant, Dirk Deschrijver, Davy Pissoort, and Tom Dhaene. 2013. “Efficient Measurement Procedure for Hotspot Detection in Near-field Pattern of Electronic Devices.” In BESTCOM Meeting, Abstracts.
Vancouver
1.
Singh P, Deschrijver D, Pissoort D, Dhaene T. Efficient measurement procedure for hotspot detection in near-field pattern of electronic devices. BESTCOM Meeting, Abstracts. 2013.
IEEE
[1]
P. Singh, D. Deschrijver, D. Pissoort, and T. Dhaene, “Efficient measurement procedure for hotspot detection in near-field pattern of electronic devices,” in BESTCOM Meeting, Abstracts, Ghent, Belgium, 2013.
@inproceedings{4083180,
  author       = {Singh, Prashant and Deschrijver, Dirk and Pissoort, Davy and Dhaene, Tom},
  booktitle    = {BESTCOM Meeting, Abstracts},
  keywords     = {IBCN},
  language     = {eng},
  location     = {Ghent, Belgium},
  title        = {Efficient measurement procedure for hotspot detection in near-field pattern of electronic devices},
  year         = {2013},
}