Resilience in all-optical label switching networks: a node dimensioning point of view - art. no. 602228
- Author
- Ruth Van Caenegem, Didier Colle (UGent) , Mario Pickavet (UGent) and P DERNEESTER
- Organization
Citation
Please use this url to cite or link to this publication: http://hdl.handle.net/1854/LU-405839
- MLA
- Van Caenegem, Ruth, et al. “Resilience in All-Optical Label Switching Networks: A Node Dimensioning Point of View - Art. No. 602228.” NETWORK ARCHITECTURES, MANAGEMENT, AND APPLICATIONS III, PTS1 AND 2, edited by GK Chang et al., SPIE-INT SOCIETY OPTICAL ENGINEERING, 2005, pp. 2228–2228.
- APA
- Van Caenegem, R., Colle, D., Pickavet, M., & DERNEESTER, P. (2005). Resilience in all-optical label switching networks: a node dimensioning point of view - art. no. 602228. In G. Chang, K. Cheung, G. Li, & K. Sato (Eds.), NETWORK ARCHITECTURES, MANAGEMENT, AND APPLICATIONS III, PTS1 AND 2 (pp. 2228–2228). SPIE-INT SOCIETY OPTICAL ENGINEERING.
- Chicago author-date
- Van Caenegem, Ruth, Didier Colle, Mario Pickavet, and P DERNEESTER. 2005. “Resilience in All-Optical Label Switching Networks: A Node Dimensioning Point of View - Art. No. 602228.” In NETWORK ARCHITECTURES, MANAGEMENT, AND APPLICATIONS III, PTS1 AND 2, edited by GK Chang, KW Cheung, G Li, and KI Sato, 2228–2228. SPIE-INT SOCIETY OPTICAL ENGINEERING.
- Chicago author-date (all authors)
- Van Caenegem, Ruth, Didier Colle, Mario Pickavet, and P DERNEESTER. 2005. “Resilience in All-Optical Label Switching Networks: A Node Dimensioning Point of View - Art. No. 602228.” In NETWORK ARCHITECTURES, MANAGEMENT, AND APPLICATIONS III, PTS1 AND 2, ed by. GK Chang, KW Cheung, G Li, and KI Sato, 2228–2228. SPIE-INT SOCIETY OPTICAL ENGINEERING.
- Vancouver
- 1.Van Caenegem R, Colle D, Pickavet M, DERNEESTER P. Resilience in all-optical label switching networks: a node dimensioning point of view - art. no. 602228. In: Chang G, Cheung K, Li G, Sato K, editors. NETWORK ARCHITECTURES, MANAGEMENT, AND APPLICATIONS III, PTS1 AND 2. SPIE-INT SOCIETY OPTICAL ENGINEERING; 2005. p. 2228–2228.
- IEEE
- [1]R. Van Caenegem, D. Colle, M. Pickavet, and P. DERNEESTER, “Resilience in all-optical label switching networks: a node dimensioning point of view - art. no. 602228,” in NETWORK ARCHITECTURES, MANAGEMENT, AND APPLICATIONS III, PTS1 AND 2, 2005, pp. 2228–2228.
@inproceedings{405839,
author = {{Van Caenegem, Ruth and Colle, Didier and Pickavet, Mario and DERNEESTER, P}},
booktitle = {{NETWORK ARCHITECTURES, MANAGEMENT, AND APPLICATIONS III, PTS1 AND 2}},
editor = {{Chang, GK and Cheung, KW and Li, G and Sato, KI}},
isbn = {{0-8194-6053-2}},
issn = {{0277-786X}},
language = {{eng}},
pages = {{2228--2228}},
publisher = {{SPIE-INT SOCIETY OPTICAL ENGINEERING}},
title = {{Resilience in all-optical label switching networks: a node dimensioning point of view - art. no. 602228}},
year = {{2005}},
}