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Texture of silicide films on Si(001): the occurrence of axiotaxy in cubic CoSi2, tetragonal alpha-FeSi2 and orthorhombic NiSi

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MLA
Detavernier, Christophe, and C LAVOIE. “Texture of Silicide Films on Si(001): The Occurrence of Axiotaxy in Cubic CoSi2, Tetragonal alpha-FeSi2 and Orthorhombic NiSi.” Ed. C Claeys et al. 2004: 7TH INTERNATIONAL CONFERENCE ON SOLID-STATE AND INTEGRATED CIRCUITS TECHNOLOGY, VOLS 1- 3, PROCEEDINGS (2004): 445–450. Print.
APA
Detavernier, C., & LAVOIE, C. (2004). Texture of silicide films on Si(001): the occurrence of axiotaxy in cubic CoSi2, tetragonal alpha-FeSi2 and orthorhombic NiSi. (C Claeys, T. Hiramoto, R. Huang, J. Liou, & M. Yu, Eds.)2004: 7TH INTERNATIONAL CONFERENCE ON SOLID-STATE AND INTEGRATED CIRCUITS TECHNOLOGY, VOLS 1- 3, PROCEEDINGS, 445–450.
Chicago author-date
Detavernier, Christophe, and C LAVOIE. 2004. “Texture of Silicide Films on Si(001): The Occurrence of Axiotaxy in Cubic CoSi2, Tetragonal alpha-FeSi2 and Orthorhombic NiSi.” Ed. C Claeys, T Hiramoto, R Huang, JJ Liou, and M Yu. 2004: 7TH INTERNATIONAL CONFERENCE ON SOLID-STATE AND INTEGRATED CIRCUITS TECHNOLOGY, VOLS 1- 3, PROCEEDINGS: 445–450.
Chicago author-date (all authors)
Detavernier, Christophe, and C LAVOIE. 2004. “Texture of Silicide Films on Si(001): The Occurrence of Axiotaxy in Cubic CoSi2, Tetragonal alpha-FeSi2 and Orthorhombic NiSi.” Ed. C Claeys, T Hiramoto, R Huang, JJ Liou, and M Yu. 2004: 7TH INTERNATIONAL CONFERENCE ON SOLID-STATE AND INTEGRATED CIRCUITS TECHNOLOGY, VOLS 1- 3, PROCEEDINGS: 445–450.
Vancouver
1.
Detavernier C, LAVOIE C. Texture of silicide films on Si(001): the occurrence of axiotaxy in cubic CoSi2, tetragonal alpha-FeSi2 and orthorhombic NiSi. Claeys C, Hiramoto T, Huang R, Liou J, Yu M, editors. 2004: 7TH INTERNATIONAL CONFERENCE ON SOLID-STATE AND INTEGRATED CIRCUITS TECHNOLOGY, VOLS 1- 3, PROCEEDINGS. IEEE; 2004;445–50.
IEEE
[1]
C. Detavernier and C. LAVOIE, “Texture of silicide films on Si(001): the occurrence of axiotaxy in cubic CoSi2, tetragonal alpha-FeSi2 and orthorhombic NiSi,” 2004: 7TH INTERNATIONAL CONFERENCE ON SOLID-STATE AND INTEGRATED CIRCUITS TECHNOLOGY, VOLS 1- 3, PROCEEDINGS, pp. 445–450, 2004.
@article{404863,
  author       = {Detavernier, Christophe and LAVOIE, C},
  editor       = {Claeys, C and Hiramoto, T and Huang, R and Liou, JJ and Yu, M},
  isbn         = {0-7803-8511-X},
  journal      = {2004: 7TH INTERNATIONAL CONFERENCE ON SOLID-STATE AND INTEGRATED CIRCUITS TECHNOLOGY, VOLS 1- 3, PROCEEDINGS},
  language     = {eng},
  pages        = {445--450},
  publisher    = {IEEE},
  title        = {Texture of silicide films on Si(001): the occurrence of axiotaxy in cubic CoSi2, tetragonal alpha-FeSi2 and orthorhombic NiSi},
  year         = {2004},
}

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