Ghent University Academic Bibliography

Advanced

Analysis of soil roughness measurements using a 25 m laser profiler and a 4 m wide meshboard

Moira Callens and Niko Verhoest UGent (2004) IEEE International Symposium on Geoscience and Remote Sensing (IGARSS). p.1653-1656
abstract
The currently available backscatter inversion models often do not yield satisfactory results when applied to natural surfaces clue to art inaccurate characterization of the soil roughness properties. This is caused by inadequacy of the applied soil roughness measuring techniques and by the high variation on soil roughness parameters within one agricultural field. From a theoretical study it was found that long profiles are necessary to obtain an accurate estimation of the roughness parameters. Short profiles, which are generally measured. Lend to underestimate the roughness parameters. Soil roughness data were collected over three different tillages with the ESA laser profiler, which allows measurements of profiles tip to 25 in, and a 4 in wide meshboard. This research compares the two measuring techniques and studies the possibility of compensating for the underestimation of short profiles. Analysis of the 25 in laser profiles confirmed the theoretical study that the rms height and the correlation length increase as profile length increases. The rms height reached a constant value for all three tillages whereas the correlation length only reached a constant value for the roughest tillages. The dependency on profile length of both rms height and correlation length could be quite accurately modeled which allowed the extrapolation from short profile data to rms height and correlation length values at higher profile lengths. Additionally it was found that it is possible to convert the less accurate meshboard derived rms values to those obtained from the laser profiler. This conversion greatly improves when the parameter values of at least six, 4 no profiles are averaged. For the correlation length this conversion is not possible due to the high variance on this parameter.
Please use this url to cite or link to this publication:
author
organization
year
type
conference
publication status
published
subject
in
IEEE International Symposium on Geoscience and Remote Sensing (IGARSS)
issue title
IGARSS 2004 : IEEE international geoscience and remote sensing symposium proceedings, vols 1-7 : science for society : exploring and managing a changing planet
pages
1653 - 1656
publisher
IEEE
place of publication
New York, NY, USA
conference name
IEEE International Geoscience and Remote Sensing Symposium
conference location
Anchorage, AK, USA
conference start
2004-09-20
conference end
2004-09-24
Web of Science type
Article
Web of Science id
000227006900432
ISBN
9780780387423
language
English
UGent publication?
yes
classification
P1
id
404841
handle
http://hdl.handle.net/1854/LU-404841
date created
2008-05-14 16:22:00
date last changed
2012-03-28 16:24:37
@inproceedings{404841,
  abstract     = {The currently available backscatter inversion models often do not yield satisfactory results when applied to natural surfaces clue to art inaccurate characterization of the soil roughness properties. This is caused by inadequacy of the applied soil roughness measuring techniques and by the high variation on soil roughness parameters within one agricultural field. From a theoretical study it was found that long profiles are necessary to obtain an accurate estimation of the roughness parameters. Short profiles, which are generally measured. Lend to underestimate the roughness parameters. 
Soil roughness data were collected over three different tillages with the ESA laser profiler, which allows measurements of profiles tip to 25 in, and a 4 in wide meshboard. This research compares the two measuring techniques and studies the possibility of compensating for the underestimation of short profiles. 
Analysis of the 25 in laser profiles confirmed the theoretical study that the rms height and the correlation length increase as profile length increases. The rms height reached a constant value for all three tillages whereas the correlation length only reached a constant value for the roughest tillages. The dependency on profile length of both rms height and correlation length could be quite accurately modeled which allowed the extrapolation from short profile data to rms height and correlation length values at higher profile lengths. Additionally it was found that it is possible to convert the less accurate meshboard derived rms values to those obtained from the laser profiler. This conversion greatly improves when the parameter values of at least six, 4 no profiles are averaged. For the correlation length this conversion is not possible due to the high variance on this parameter.},
  author       = {Callens, Moira and Verhoest, Niko},
  booktitle    = {IEEE International Symposium on Geoscience and Remote Sensing (IGARSS)},
  isbn         = {9780780387423},
  language     = {eng},
  location     = {Anchorage, AK, USA},
  pages        = {1653--1656},
  publisher    = {IEEE},
  title        = {Analysis of soil roughness measurements using a 25 m laser profiler and a 4 m wide meshboard},
  year         = {2004},
}

Chicago
Callens, Moira, and Niko Verhoest. 2004. “Analysis of Soil Roughness Measurements Using a 25 m Laser Profiler and a 4 m Wide Meshboard.” In IEEE International Symposium on Geoscience and Remote Sensing (IGARSS), 1653–1656. New York, NY, USA: IEEE.
APA
Callens, M., & Verhoest, N. (2004). Analysis of soil roughness measurements using a 25 m laser profiler and a 4 m wide meshboard. IEEE International Symposium on Geoscience and Remote Sensing (IGARSS) (pp. 1653–1656). Presented at the IEEE International Geoscience and Remote Sensing Symposium, New York, NY, USA: IEEE.
Vancouver
1.
Callens M, Verhoest N. Analysis of soil roughness measurements using a 25 m laser profiler and a 4 m wide meshboard. IEEE International Symposium on Geoscience and Remote Sensing (IGARSS). New York, NY, USA: IEEE; 2004. p. 1653–6.
MLA
Callens, Moira, and Niko Verhoest. “Analysis of Soil Roughness Measurements Using a 25 m Laser Profiler and a 4 m Wide Meshboard.” IEEE International Symposium on Geoscience and Remote Sensing (IGARSS). New York, NY, USA: IEEE, 2004. 1653–1656. Print.