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Systematic design of double-sampling Sigma Delta ADC'S with modified NTF

R ROMBOUTS, Jeroen De Maeyer (UGent) , Johan Raman (UGent) and Ludo Weyten (UGent)
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Chicago
ROMBOUTS, R, Jeroen De Maeyer, Johan Raman, and Ludo Weyten. 2004. “Systematic Design of Double-sampling Sigma Delta ADC’S with Modified NTF.” 2004 IEEE INTERNATIONAL SYMPOSIUM ON CIRCUITS AND SYSTEMS, VOL 1, PROCEEDINGS: 401–404.
APA
ROMBOUTS, R., De Maeyer, J., Raman, J., & Weyten, L. (2004). Systematic design of double-sampling Sigma Delta ADC’S with modified NTF. 2004 IEEE INTERNATIONAL SYMPOSIUM ON CIRCUITS AND SYSTEMS, VOL 1, PROCEEDINGS, 401–404.
Vancouver
1.
ROMBOUTS R, De Maeyer J, Raman J, Weyten L. Systematic design of double-sampling Sigma Delta ADC’S with modified NTF. 2004 IEEE INTERNATIONAL SYMPOSIUM ON CIRCUITS AND SYSTEMS, VOL 1, PROCEEDINGS. IEEE; 2004;401–4.
MLA
ROMBOUTS, R, Jeroen De Maeyer, Johan Raman, et al. “Systematic Design of Double-sampling Sigma Delta ADC’S with Modified NTF.” 2004 IEEE INTERNATIONAL SYMPOSIUM ON CIRCUITS AND SYSTEMS, VOL 1, PROCEEDINGS (2004): 401–404. Print.
@article{404182,
  author       = {ROMBOUTS, R and De Maeyer, Jeroen and Raman, Johan and Weyten, Ludo},
  isbn         = {0-7803-8251-X},
  journal      = {2004 IEEE INTERNATIONAL SYMPOSIUM ON CIRCUITS AND SYSTEMS, VOL 1, PROCEEDINGS},
  language     = {eng},
  pages        = {401--404},
  publisher    = {IEEE},
  title        = {Systematic design of double-sampling Sigma Delta ADC'S with modified NTF},
  year         = {2004},
}

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