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Integrated optics in a standard MCM-D motherboard technology demonstrated in O/E measurement probes

Herbert De Pauw (UGent) , Johan De Baets (UGent) , Jan Vanfleteren (UGent) and André Van Calster (UGent)
(2003) ADVANCES IN ELECTRONIC PACKAGING 2003, VOL 1. p.169-176
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Citation

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MLA
De Pauw, Herbert, et al. “Integrated Optics in a Standard MCM-D Motherboard Technology Demonstrated in O/E Measurement Probes.” ADVANCES IN ELECTRONIC PACKAGING 2003, VOL 1, AMER SOC MECHANICAL ENGINEERS, 2003, pp. 169–76.
APA
De Pauw, H., De Baets, J., Vanfleteren, J., & Van Calster, A. (2003). Integrated optics in a standard MCM-D motherboard technology demonstrated in O/E measurement probes. ADVANCES IN ELECTRONIC PACKAGING 2003, VOL 1, 169–176. AMER SOC MECHANICAL ENGINEERS.
Chicago author-date
De Pauw, Herbert, Johan De Baets, Jan Vanfleteren, and André Van Calster. 2003. “Integrated Optics in a Standard MCM-D Motherboard Technology Demonstrated in O/E Measurement Probes.” In ADVANCES IN ELECTRONIC PACKAGING 2003, VOL 1, 169–76. AMER SOC MECHANICAL ENGINEERS.
Chicago author-date (all authors)
De Pauw, Herbert, Johan De Baets, Jan Vanfleteren, and André Van Calster. 2003. “Integrated Optics in a Standard MCM-D Motherboard Technology Demonstrated in O/E Measurement Probes.” In ADVANCES IN ELECTRONIC PACKAGING 2003, VOL 1, 169–176. AMER SOC MECHANICAL ENGINEERS.
Vancouver
1.
De Pauw H, De Baets J, Vanfleteren J, Van Calster A. Integrated optics in a standard MCM-D motherboard technology demonstrated in O/E measurement probes. In: ADVANCES IN ELECTRONIC PACKAGING 2003, VOL 1. AMER SOC MECHANICAL ENGINEERS; 2003. p. 169–76.
IEEE
[1]
H. De Pauw, J. De Baets, J. Vanfleteren, and A. Van Calster, “Integrated optics in a standard MCM-D motherboard technology demonstrated in O/E measurement probes,” in ADVANCES IN ELECTRONIC PACKAGING 2003, VOL 1, 2003, pp. 169–176.
@inproceedings{404090,
  author       = {{De Pauw, Herbert and De Baets, Johan and Vanfleteren, Jan and Van Calster, André}},
  booktitle    = {{ADVANCES IN ELECTRONIC PACKAGING 2003, VOL 1}},
  isbn         = {{0-7918-3690-8}},
  language     = {{eng}},
  pages        = {{169--176}},
  publisher    = {{AMER SOC MECHANICAL ENGINEERS}},
  title        = {{Integrated optics in a standard MCM-D motherboard technology demonstrated in O/E measurement probes}},
  year         = {{2003}},
}
Web of Science
Times cited: