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Photovia technology: Some important aspects for reliability

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MLA
Zhang, Suixin, Johan De Baets, André Van Calster, et al. “Photovia Technology: Some Important Aspects for Reliability.” 1999 INTERNATIONAL SYMPOSIUM ON MICROELECTRONICS, PROCEEDINGS (1999): 240–245. Print.
APA
Zhang, Suixin, De Baets, J., Van Calster, A., Corlatan, D., De Langhe, P., & Allaert, K. (1999). Photovia technology: Some important aspects for reliability. 1999 INTERNATIONAL SYMPOSIUM ON MICROELECTRONICS, PROCEEDINGS, 240–245.
Chicago author-date
Zhang, Suixin, Johan De Baets, André Van Calster, Dorina Corlatan, Pascal De Langhe, and Koenraad Allaert. 1999. “Photovia Technology: Some Important Aspects for Reliability.” 1999 INTERNATIONAL SYMPOSIUM ON MICROELECTRONICS, PROCEEDINGS: 240–245.
Chicago author-date (all authors)
Zhang, Suixin, Johan De Baets, André Van Calster, Dorina Corlatan, Pascal De Langhe, and Koenraad Allaert. 1999. “Photovia Technology: Some Important Aspects for Reliability.” 1999 INTERNATIONAL SYMPOSIUM ON MICROELECTRONICS, PROCEEDINGS: 240–245.
Vancouver
1.
Zhang S, De Baets J, Van Calster A, Corlatan D, De Langhe P, Allaert K. Photovia technology: Some important aspects for reliability. 1999 INTERNATIONAL SYMPOSIUM ON MICROELECTRONICS, PROCEEDINGS. INTERNATIONAL MICROELECTRONICS& PACKAGING SOCIETY; 1999;240–5.
IEEE
[1]
S. Zhang, J. De Baets, A. Van Calster, D. Corlatan, P. De Langhe, and K. Allaert, “Photovia technology: Some important aspects for reliability,” 1999 INTERNATIONAL SYMPOSIUM ON MICROELECTRONICS, PROCEEDINGS, pp. 240–245, 1999.
@article{400469,
  author       = {Zhang, Suixin and De Baets, Johan and Van Calster, André and Corlatan, Dorina and De Langhe, Pascal and Allaert, Koenraad},
  isbn         = {0-930815-58-0},
  issn         = {0277-786X},
  journal      = {1999 INTERNATIONAL SYMPOSIUM ON MICROELECTRONICS, PROCEEDINGS},
  language     = {eng},
  pages        = {240--245},
  publisher    = {INTERNATIONAL MICROELECTRONICS& PACKAGING SOCIETY},
  title        = {Photovia technology: Some important aspects for reliability},
  year         = {1999},
}

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