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High resolution X-ray fluorescence micro-tomography on single sediment particles

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Abstract
This work focuses on the investigation of the distribution of contaminants in individual sediment particles from the New York/New Jersey Harbor. Knowledge of the spatial distribution of the contaminants within the particles is needed to enable (1) more sophisticated approaches to the understanding of the fate and transport of the contaminants in the environment and (2) more refined methods for cleaning the sediments. The size of the investigated particles ranges from 30-80 microns. Due to the low concentration of the elements of interest and the microscopic size of the environmental particles in these measurements, the small size and high intensity of the analyzing X-ray beam was critical. The high photon flux at the ESRF Microfocus beam fine (ID13) was used as the basis for fluorescence tomography to investigate whether the inorganic compounds are taken upon the surface organic coating or whether they are distributed through the volume of the grains being analyzed. The experiments were done using a 13 keV monochromatic beam of approximately 2 mum in size having an intensity of 10(10) ph/s, allowing absolute detection limits on the 0.04-1 fg level for Ti, Cr, Mn, Fe, Ni, and Zn.

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Chicago
Vincze, Laszlo, Bart Vekemans, Imre Szaloki, Koen Janssens, Rene Van Grieken, H Feng, Keith W Jones, and Freddy Adams. 2002. “High Resolution X-ray Fluorescence Micro-tomography on Single Sediment Particles.” In Proceedings of SPIE, the International Society for Optical Engineering, ed. Ulrich Bonse, 4503:240–248. Bellingham, WA, USA: SPIE, the International Society for Optical Engineering.
APA
Vincze, L., Vekemans, B., Szaloki, I., Janssens, K., Van Grieken, R., Feng, H., Jones, K. W., et al. (2002). High resolution X-ray fluorescence micro-tomography on single sediment particles. In Ulrich Bonse (Ed.), Proceedings of SPIE, the International Society for Optical Engineering (Vol. 4503, pp. 240–248). Presented at the 3rd Conference on Developments in X-Ray Tomography, Bellingham, WA, USA: SPIE, the International Society for Optical Engineering.
Vancouver
1.
Vincze L, Vekemans B, Szaloki I, Janssens K, Van Grieken R, Feng H, et al. High resolution X-ray fluorescence micro-tomography on single sediment particles. In: Bonse U, editor. Proceedings of SPIE, the International Society for Optical Engineering. Bellingham, WA, USA: SPIE, the International Society for Optical Engineering; 2002. p. 240–8.
MLA
Vincze, Laszlo, Bart Vekemans, Imre Szaloki, et al. “High Resolution X-ray Fluorescence Micro-tomography on Single Sediment Particles.” Proceedings of SPIE, the International Society for Optical Engineering. Ed. Ulrich Bonse. Vol. 4503. Bellingham, WA, USA: SPIE, the International Society for Optical Engineering, 2002. 240–248. Print.
@inproceedings{386495,
  abstract     = {This work focuses on the investigation of the distribution of contaminants in individual sediment particles from the New York/New Jersey Harbor. Knowledge of the spatial distribution of the contaminants within the particles is needed to enable (1) more sophisticated approaches to the understanding of the fate and transport of the contaminants in the environment and (2) more refined methods for cleaning the sediments. The size of the investigated particles ranges from 30-80 microns. Due to the low concentration of the elements of interest and the microscopic size of the environmental particles in these measurements, the small size and high intensity of the analyzing X-ray beam was critical. The high photon flux at the ESRF Microfocus beam fine (ID13) was used as the basis for fluorescence tomography to investigate whether the inorganic compounds are taken upon the surface organic coating or whether they are distributed through the volume of the grains being analyzed. The experiments were done using a 13 keV monochromatic beam of approximately 2 mum in size having an intensity of 10(10) ph/s, allowing absolute detection limits on the 0.04-1 fg level for Ti, Cr, Mn, Fe, Ni, and Zn.},
  author       = {Vincze, Laszlo and Vekemans, Bart and Szaloki, Imre and Janssens, Koen and Van Grieken, Rene and Feng, H and Jones, Keith W and Adams, Freddy},
  booktitle    = {Proceedings of SPIE, the International Society for Optical Engineering},
  editor       = {Bonse, Ulrich},
  isbn         = {9780819442178},
  issn         = {0277-786X},
  language     = {eng},
  location     = {San Diego, CA, USA},
  pages        = {240--248},
  publisher    = {SPIE, the International Society for Optical Engineering},
  title        = {High resolution X-ray fluorescence micro-tomography on single sediment particles},
  url          = {http://dx.doi.org/10.1117/12.452865},
  volume       = {4503},
  year         = {2002},
}

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