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High resolution X-ray fluorescence micro-tomography on single sediment particles

Laszlo Vincze UGent, Bart Vekemans UGent, Imre Szaloki, Koen Janssens, Rene Van Grieken, H Feng, Keith W Jones and Freddy Adams (2002) Proceedings of SPIE, the International Society for Optical Engineering. 4503. p.240-248
abstract
This work focuses on the investigation of the distribution of contaminants in individual sediment particles from the New York/New Jersey Harbor. Knowledge of the spatial distribution of the contaminants within the particles is needed to enable (1) more sophisticated approaches to the understanding of the fate and transport of the contaminants in the environment and (2) more refined methods for cleaning the sediments. The size of the investigated particles ranges from 30-80 microns. Due to the low concentration of the elements of interest and the microscopic size of the environmental particles in these measurements, the small size and high intensity of the analyzing X-ray beam was critical. The high photon flux at the ESRF Microfocus beam fine (ID13) was used as the basis for fluorescence tomography to investigate whether the inorganic compounds are taken upon the surface organic coating or whether they are distributed through the volume of the grains being analyzed. The experiments were done using a 13 keV monochromatic beam of approximately 2 mum in size having an intensity of 10(10) ph/s, allowing absolute detection limits on the 0.04-1 fg level for Ti, Cr, Mn, Fe, Ni, and Zn.
Please use this url to cite or link to this publication:
author
organization
year
type
conference
publication status
published
subject
in
Proceedings of SPIE, the International Society for Optical Engineering
Proc. SPIE Int. Soc. Opt. Eng.
editor
Ulrich Bonse
volume
4503
issue title
Developments iin X-ray tomography III
pages
240 - 248
publisher
SPIE, the International Society for Optical Engineering
place of publication
Bellingham, WA, USA
conference name
3rd Conference on Developments in X-Ray Tomography
conference location
San Diego, CA, USA
conference start
2001-08-02
conference end
2001-08-03
Web of Science type
Proceedings Paper
Web of Science id
000175177400027
ISSN
0277-786X
ISBN
9780819442178
DOI
10.1117/12.452865
language
English
UGent publication?
no
classification
P1
id
386495
handle
http://hdl.handle.net/1854/LU-386495
date created
2008-02-07 10:13:00
date last changed
2012-11-08 16:38:41
@inproceedings{386495,
  abstract     = {This work focuses on the investigation of the distribution of contaminants in individual sediment particles from the New York/New Jersey Harbor. Knowledge of the spatial distribution of the contaminants within the particles is needed to enable (1) more sophisticated approaches to the understanding of the fate and transport of the contaminants in the environment and (2) more refined methods for cleaning the sediments. The size of the investigated particles ranges from 30-80 microns. Due to the low concentration of the elements of interest and the microscopic size of the environmental particles in these measurements, the small size and high intensity of the analyzing X-ray beam was critical. The high photon flux at the ESRF Microfocus beam fine (ID13) was used as the basis for fluorescence tomography to investigate whether the inorganic compounds are taken upon the surface organic coating or whether they are distributed through the volume of the grains being analyzed. The experiments were done using a 13 keV monochromatic beam of approximately 2 mum in size having an intensity of 10(10) ph/s, allowing absolute detection limits on the 0.04-1 fg level for Ti, Cr, Mn, Fe, Ni, and Zn.},
  author       = {Vincze, Laszlo and Vekemans, Bart and Szaloki, Imre and Janssens, Koen and Van Grieken, Rene and Feng, H and Jones, Keith W and Adams, Freddy},
  booktitle    = {Proceedings of SPIE, the International Society for Optical Engineering},
  editor       = {Bonse, Ulrich},
  isbn         = {9780819442178},
  issn         = {0277-786X},
  language     = {eng},
  location     = {San Diego, CA, USA},
  pages        = {240--248},
  publisher    = {SPIE, the International Society for Optical Engineering},
  title        = {High resolution X-ray fluorescence micro-tomography on single sediment particles},
  url          = {http://dx.doi.org/10.1117/12.452865},
  volume       = {4503},
  year         = {2002},
}

Chicago
Vincze, Laszlo, Bart Vekemans, Imre Szaloki, Koen Janssens, Rene Van Grieken, H Feng, Keith W Jones, and Freddy Adams. 2002. “High Resolution X-ray Fluorescence Micro-tomography on Single Sediment Particles.” In Proceedings of SPIE, the International Society for Optical Engineering, ed. Ulrich Bonse, 4503:240–248. Bellingham, WA, USA: SPIE, the International Society for Optical Engineering.
APA
Vincze, L., Vekemans, B., Szaloki, I., Janssens, K., Van Grieken, R., Feng, H., Jones, K. W., et al. (2002). High resolution X-ray fluorescence micro-tomography on single sediment particles. In Ulrich Bonse (Ed.), Proceedings of SPIE, the International Society for Optical Engineering (Vol. 4503, pp. 240–248). Presented at the 3rd Conference on Developments in X-Ray Tomography, Bellingham, WA, USA: SPIE, the International Society for Optical Engineering.
Vancouver
1.
Vincze L, Vekemans B, Szaloki I, Janssens K, Van Grieken R, Feng H, et al. High resolution X-ray fluorescence micro-tomography on single sediment particles. In: Bonse U, editor. Proceedings of SPIE, the International Society for Optical Engineering. Bellingham, WA, USA: SPIE, the International Society for Optical Engineering; 2002. p. 240–8.
MLA
Vincze, Laszlo, Bart Vekemans, Imre Szaloki, et al. “High Resolution X-ray Fluorescence Micro-tomography on Single Sediment Particles.” Proceedings of SPIE, the International Society for Optical Engineering. Ed. Ulrich Bonse. Vol. 4503. Bellingham, WA, USA: SPIE, the International Society for Optical Engineering, 2002. 240–248. Print.