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Characterization of the texture of silicide films using electron backscattered diffraction

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Chicago
De Keyser, Koen, Christophe Detavernier, and Roland Vanmeirhaeghe. 2007. “Characterization of the Texture of Silicide Films Using Electron Backscattered Diffraction.” Applied Physics Letters 90 (12).
APA
De Keyser, Koen, Detavernier, C., & Vanmeirhaeghe, R. (2007). Characterization of the texture of silicide films using electron backscattered diffraction. APPLIED PHYSICS LETTERS, 90(12).
Vancouver
1.
De Keyser K, Detavernier C, Vanmeirhaeghe R. Characterization of the texture of silicide films using electron backscattered diffraction. APPLIED PHYSICS LETTERS. AMER INST PHYSICS; 2007;90(12).
MLA
De Keyser, Koen, Christophe Detavernier, and Roland Vanmeirhaeghe. “Characterization of the Texture of Silicide Films Using Electron Backscattered Diffraction.” APPLIED PHYSICS LETTERS 90.12 (2007): n. pag. Print.
@article{366601,
  author       = {De Keyser, Koen and Detavernier, Christophe and Vanmeirhaeghe, Roland},
  issn         = {0003-6951},
  journal      = {APPLIED PHYSICS LETTERS},
  language     = {eng},
  number       = {12},
  publisher    = {AMER INST PHYSICS},
  title        = {Characterization of the texture of silicide films using electron backscattered diffraction},
  volume       = {90},
  year         = {2007},
}

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