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Low-cost BER tester measures errors in low-data-rate applications

(2005) EDN. 50(25). p.123-124
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Citation

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MLA
Mélange, Cedric, Johan Bauwelinck, Jo Pletinckx, et al. “Low-cost BER Tester Measures Errors in Low-data-rate Applications.” EDN 50.25 (2005): 123–124. Print.
APA
Mélange, C., Bauwelinck, J., Pletinckx, J., & Vandewege, J. (2005). Low-cost BER tester measures errors in low-data-rate applications. EDN, 50(25), 123–124.
Chicago author-date
Mélange, Cedric, Johan Bauwelinck, Jo Pletinckx, and Jan Vandewege. 2005. “Low-cost BER Tester Measures Errors in Low-data-rate Applications.” EDN 50 (25): 123–124.
Chicago author-date (all authors)
Mélange, Cedric, Johan Bauwelinck, Jo Pletinckx, and Jan Vandewege. 2005. “Low-cost BER Tester Measures Errors in Low-data-rate Applications.” EDN 50 (25): 123–124.
Vancouver
1.
Mélange C, Bauwelinck J, Pletinckx J, Vandewege J. Low-cost BER tester measures errors in low-data-rate applications. EDN. 2005;50(25):123–4.
IEEE
[1]
C. Mélange, J. Bauwelinck, J. Pletinckx, and J. Vandewege, “Low-cost BER tester measures errors in low-data-rate applications,” EDN, vol. 50, no. 25, pp. 123–124, 2005.
@article{350796,
  author       = {Mélange, Cedric and Bauwelinck, Johan and Pletinckx, Jo and Vandewege, Jan},
  issn         = {0012-7515},
  journal      = {EDN},
  language     = {eng},
  number       = {25},
  pages        = {123--124},
  title        = {Low-cost BER tester measures errors in low-data-rate applications},
  volume       = {50},
  year         = {2005},
}

Web of Science
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