
Determination of oxide precipitate phase and morphology in silicon and germanium using infra-red absorption spectroscopy
- Author
- Olivier De Gryse, Jan Vanhellemont (UGent) and Paul Clauws (UGent)
- Organization
Citation
Please use this url to cite or link to this publication: http://hdl.handle.net/1854/LU-345223
- MLA
- De Gryse, Olivier, Jan Vanhellemont, and Paul Clauws. “Determination of Oxide Precipitate Phase and Morphology in Silicon and Germanium Using Infra-red Absorption Spectroscopy.” MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING 9.1-3 (2006): 246–251. Print.
- APA
- De Gryse, Olivier, Vanhellemont, J., & Clauws, P. (2006). Determination of oxide precipitate phase and morphology in silicon and germanium using infra-red absorption spectroscopy. MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING, 9(1-3), 246–251.
- Chicago author-date
- De Gryse, Olivier, Jan Vanhellemont, and Paul Clauws. 2006. “Determination of Oxide Precipitate Phase and Morphology in Silicon and Germanium Using Infra-red Absorption Spectroscopy.” Materials Science in Semiconductor Processing 9 (1-3): 246–251.
- Chicago author-date (all authors)
- De Gryse, Olivier, Jan Vanhellemont, and Paul Clauws. 2006. “Determination of Oxide Precipitate Phase and Morphology in Silicon and Germanium Using Infra-red Absorption Spectroscopy.” Materials Science in Semiconductor Processing 9 (1-3): 246–251.
- Vancouver
- 1.De Gryse O, Vanhellemont J, Clauws P. Determination of oxide precipitate phase and morphology in silicon and germanium using infra-red absorption spectroscopy. MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING. ELSEVIER SCI LTD; 2006;9(1-3):246–51.
- IEEE
- [1]O. De Gryse, J. Vanhellemont, and P. Clauws, “Determination of oxide precipitate phase and morphology in silicon and germanium using infra-red absorption spectroscopy,” MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING, vol. 9, no. 1–3, pp. 246–251, 2006.
@article{345223, author = {De Gryse, Olivier and Vanhellemont, Jan and Clauws, Paul}, issn = {1369-8001}, journal = {MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING}, language = {eng}, number = {1-3}, pages = {246--251}, publisher = {ELSEVIER SCI LTD}, title = {Determination of oxide precipitate phase and morphology in silicon and germanium using infra-red absorption spectroscopy}, volume = {9}, year = {2006}, }