Advanced search
1 file | 1.86 MB Add to list

Detection and distribution analysis of organosilicon compounds in wood by means of SEM-EDX and micro-CT

Liesbeth De Vetter (UGent) , Veerle Cnudde (UGent) , Bert Masschaele (UGent) , Patric Jacobs (UGent) and Joris Van Acker (UGent)
(2006) MATERIALS CHARACTERIZATION. 56(1). p.39-48
Author
Organization
Keywords
silane, siloxane, wood modification, scanning electron microscopy, Micro-CT, ALKOXYSILANE COUPLING AGENTS, CHEMICAL MODIFICATION, SOLID WOOD

Downloads

  • (...).pdf
    • full text
    • |
    • UGent only
    • |
    • PDF
    • |
    • 1.86 MB

Citation

Please use this url to cite or link to this publication:

MLA
De Vetter, Liesbeth, et al. “Detection and Distribution Analysis of Organosilicon Compounds in Wood by Means of SEM-EDX and Micro-CT.” MATERIALS CHARACTERIZATION, vol. 56, no. 1, 2006, pp. 39–48, doi:10.1016/j.matchar.2005.09.007.
APA
De Vetter, L., Cnudde, V., Masschaele, B., Jacobs, P., & Van Acker, J. (2006). Detection and distribution analysis of organosilicon compounds in wood by means of SEM-EDX and micro-CT. MATERIALS CHARACTERIZATION, 56(1), 39–48. https://doi.org/10.1016/j.matchar.2005.09.007
Chicago author-date
De Vetter, Liesbeth, Veerle Cnudde, Bert Masschaele, Patric Jacobs, and Joris Van Acker. 2006. “Detection and Distribution Analysis of Organosilicon Compounds in Wood by Means of SEM-EDX and Micro-CT.” MATERIALS CHARACTERIZATION 56 (1): 39–48. https://doi.org/10.1016/j.matchar.2005.09.007.
Chicago author-date (all authors)
De Vetter, Liesbeth, Veerle Cnudde, Bert Masschaele, Patric Jacobs, and Joris Van Acker. 2006. “Detection and Distribution Analysis of Organosilicon Compounds in Wood by Means of SEM-EDX and Micro-CT.” MATERIALS CHARACTERIZATION 56 (1): 39–48. doi:10.1016/j.matchar.2005.09.007.
Vancouver
1.
De Vetter L, Cnudde V, Masschaele B, Jacobs P, Van Acker J. Detection and distribution analysis of organosilicon compounds in wood by means of SEM-EDX and micro-CT. MATERIALS CHARACTERIZATION. 2006;56(1):39–48.
IEEE
[1]
L. De Vetter, V. Cnudde, B. Masschaele, P. Jacobs, and J. Van Acker, “Detection and distribution analysis of organosilicon compounds in wood by means of SEM-EDX and micro-CT,” MATERIALS CHARACTERIZATION, vol. 56, no. 1, pp. 39–48, 2006.
@article{328496,
  author       = {{De Vetter, Liesbeth and Cnudde, Veerle and Masschaele, Bert and Jacobs, Patric and Van Acker, Joris}},
  issn         = {{1044-5803}},
  journal      = {{MATERIALS CHARACTERIZATION}},
  keywords     = {{silane,siloxane,wood modification,scanning electron microscopy,Micro-CT,ALKOXYSILANE COUPLING AGENTS,CHEMICAL MODIFICATION,SOLID WOOD}},
  language     = {{eng}},
  number       = {{1}},
  pages        = {{39--48}},
  title        = {{Detection and distribution analysis of organosilicon compounds in wood by means of SEM-EDX and micro-CT}},
  url          = {{http://doi.org/10.1016/j.matchar.2005.09.007}},
  volume       = {{56}},
  year         = {{2006}},
}

Altmetric
View in Altmetric
Web of Science
Times cited: