Detection and distribution analysis of organosilicon compounds in wood by means of SEM-EDX and micro-CT
- Author
- Liesbeth De Vetter (UGent) , Veerle Cnudde (UGent) , Bert Masschaele (UGent) , Patric Jacobs (UGent) and Joris Van Acker (UGent)
- Organization
- Keywords
- silane, siloxane, wood modification, scanning electron microscopy, Micro-CT, ALKOXYSILANE COUPLING AGENTS, CHEMICAL MODIFICATION, SOLID WOOD
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Citation
Please use this url to cite or link to this publication: http://hdl.handle.net/1854/LU-328496
- MLA
- De Vetter, Liesbeth, et al. “Detection and Distribution Analysis of Organosilicon Compounds in Wood by Means of SEM-EDX and Micro-CT.” MATERIALS CHARACTERIZATION, vol. 56, no. 1, 2006, pp. 39–48, doi:10.1016/j.matchar.2005.09.007.
- APA
- De Vetter, L., Cnudde, V., Masschaele, B., Jacobs, P., & Van Acker, J. (2006). Detection and distribution analysis of organosilicon compounds in wood by means of SEM-EDX and micro-CT. MATERIALS CHARACTERIZATION, 56(1), 39–48. https://doi.org/10.1016/j.matchar.2005.09.007
- Chicago author-date
- De Vetter, Liesbeth, Veerle Cnudde, Bert Masschaele, Patric Jacobs, and Joris Van Acker. 2006. “Detection and Distribution Analysis of Organosilicon Compounds in Wood by Means of SEM-EDX and Micro-CT.” MATERIALS CHARACTERIZATION 56 (1): 39–48. https://doi.org/10.1016/j.matchar.2005.09.007.
- Chicago author-date (all authors)
- De Vetter, Liesbeth, Veerle Cnudde, Bert Masschaele, Patric Jacobs, and Joris Van Acker. 2006. “Detection and Distribution Analysis of Organosilicon Compounds in Wood by Means of SEM-EDX and Micro-CT.” MATERIALS CHARACTERIZATION 56 (1): 39–48. doi:10.1016/j.matchar.2005.09.007.
- Vancouver
- 1.De Vetter L, Cnudde V, Masschaele B, Jacobs P, Van Acker J. Detection and distribution analysis of organosilicon compounds in wood by means of SEM-EDX and micro-CT. MATERIALS CHARACTERIZATION. 2006;56(1):39–48.
- IEEE
- [1]L. De Vetter, V. Cnudde, B. Masschaele, P. Jacobs, and J. Van Acker, “Detection and distribution analysis of organosilicon compounds in wood by means of SEM-EDX and micro-CT,” MATERIALS CHARACTERIZATION, vol. 56, no. 1, pp. 39–48, 2006.
@article{328496,
author = {{De Vetter, Liesbeth and Cnudde, Veerle and Masschaele, Bert and Jacobs, Patric and Van Acker, Joris}},
issn = {{1044-5803}},
journal = {{MATERIALS CHARACTERIZATION}},
keywords = {{silane,siloxane,wood modification,scanning electron microscopy,Micro-CT,ALKOXYSILANE COUPLING AGENTS,CHEMICAL MODIFICATION,SOLID WOOD}},
language = {{eng}},
number = {{1}},
pages = {{39--48}},
title = {{Detection and distribution analysis of organosilicon compounds in wood by means of SEM-EDX and micro-CT}},
url = {{http://doi.org/10.1016/j.matchar.2005.09.007}},
volume = {{56}},
year = {{2006}},
}
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