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Chicago
Van der Weken, Dietrich, Mike Nachtegael, Valérie De Witte, Stefan Schulte, and Etienne Kerre. 2005. “A Survey on the Use and the Construction of Fuzzy Similarity Measures in Image Processing.” In CIMSA 2005 Proceedings of the 2005 IEEE International Conference on Computational Intelligence for Measurement Systems and Applications. IEEE.
APA
Van der Weken, Dietrich, Nachtegael, M., De Witte, V., Schulte, S., & Kerre, E. (2005). A survey on the use and the construction of fuzzy similarity measures in image processing. CIMSA 2005 Proceedings of the 2005 IEEE International Conference on Computational Intelligence for Measurement Systems and Applications. IEEE.
Vancouver
1.
Van der Weken D, Nachtegael M, De Witte V, Schulte S, Kerre E. A survey on the use and the construction of fuzzy similarity measures in image processing. CIMSA 2005 Proceedings of the 2005 IEEE International Conference on Computational Intelligence for Measurement Systems and Applications. IEEE; 2005.
MLA
Van der Weken, Dietrich, Mike Nachtegael, Valérie De Witte, et al. “A Survey on the Use and the Construction of Fuzzy Similarity Measures in Image Processing.” CIMSA 2005 Proceedings of the 2005 IEEE International Conference on Computational Intelligence for Measurement Systems and Applications. IEEE, 2005. Print.
@inproceedings{325941,
  author       = {Van der Weken, Dietrich and Nachtegael, Mike and De Witte, Val{\'e}rie and Schulte, Stefan and Kerre, Etienne},
  booktitle    = {CIMSA 2005 Proceedings of the 2005 IEEE International Conference on Computational Intelligence for Measurement Systems and Applications},
  isbn         = {0-7803-9026-1},
  publisher    = {IEEE},
  title        = {A survey on the use and the construction of fuzzy similarity measures in image processing},
  year         = {2005},
}