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Practical implementation of a sequential sampling algorithm for EMI near-field scanning

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Citation

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MLA
Van der Streek, Bram et al. “Practical Implementation of a Sequential Sampling Algorithm for EMI Near-field Scanning.” The International Symposium on Electromagnetic Compatibility, Proceedings. 2012. 1–5. Print.
APA
Van der Streek, B., Vanhee, F., Boesman, B., Pissoort, D., Deschrijver, D., Couckuyt, I., & Dhaene, T. (2012). Practical implementation of a sequential sampling algorithm for EMI near-field scanning. The International Symposium on Electromagnetic Compatibility, Proceedings (pp. 1–5). Presented at the The International Symposium on Electromagnetic Compatibility (EMC Europe - 2012).
Chicago author-date
Van der Streek, Bram, Filip Vanhee, Bart Boesman, Davy Pissoort, Dirk Deschrijver, Ivo Couckuyt, and Tom Dhaene. 2012. “Practical Implementation of a Sequential Sampling Algorithm for EMI Near-field Scanning.” In The International Symposium on Electromagnetic Compatibility, Proceedings, 1–5.
Chicago author-date (all authors)
Van der Streek, Bram, Filip Vanhee, Bart Boesman, Davy Pissoort, Dirk Deschrijver, Ivo Couckuyt, and Tom Dhaene. 2012. “Practical Implementation of a Sequential Sampling Algorithm for EMI Near-field Scanning.” In The International Symposium on Electromagnetic Compatibility, Proceedings, 1–5.
Vancouver
1.
Van der Streek B, Vanhee F, Boesman B, Pissoort D, Deschrijver D, Couckuyt I, et al. Practical implementation of a sequential sampling algorithm for EMI near-field scanning. The International Symposium on Electromagnetic Compatibility, Proceedings. 2012. p. 1–5.
IEEE
[1]
B. Van der Streek et al., “Practical implementation of a sequential sampling algorithm for EMI near-field scanning,” in The International Symposium on Electromagnetic Compatibility, Proceedings, Rome, Italy, 2012, pp. 1–5.
@inproceedings{3237459,
  author       = {Van der Streek, Bram and Vanhee, Filip and Boesman, Bart and Pissoort, Davy and Deschrijver, Dirk and Couckuyt, Ivo and Dhaene, Tom},
  booktitle    = {The International Symposium on Electromagnetic Compatibility, Proceedings},
  isbn         = {9781467307178},
  keywords     = {IBCN},
  language     = {eng},
  location     = {Rome, Italy},
  pages        = {1--5},
  title        = {Practical implementation of a sequential sampling algorithm for EMI near-field scanning},
  year         = {2012},
}