Advanced search
1 file | 4.23 MB

Three dimensional reciprocal space measurement by x-ray diffraction using linear and area detectors: applications to texture and defects determination in oriented thin films and nanoprecipitates

Author
Organization
Keywords
DYNAMICS, SCATTERING, POLE FIGURES

Downloads

  • (...).pdf
    • full text
    • |
    • UGent only
    • |
    • PDF
    • |
    • 4.23 MB

Citation

Please use this url to cite or link to this publication:

Chicago
Gaudet, Simon, Koen De Keyser, Samuel Lambert-Milot, Jean Jordan-Sweet, Christophe Detavernier, Christian Lavoie, and Patrick Desjardins. 2013. “Three Dimensional Reciprocal Space Measurement by X-ray Diffraction Using Linear and Area Detectors: Applications to Texture and Defects Determination in Oriented Thin Films and Nanoprecipitates.” Journal of Vacuum Science & Technology A 31 (2).
APA
Gaudet, S., De Keyser, K., Lambert-Milot, S., Jordan-Sweet, J., Detavernier, C., Lavoie, C., & Desjardins, P. (2013). Three dimensional reciprocal space measurement by x-ray diffraction using linear and area detectors: applications to texture and defects determination in oriented thin films and nanoprecipitates. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, 31(2).
Vancouver
1.
Gaudet S, De Keyser K, Lambert-Milot S, Jordan-Sweet J, Detavernier C, Lavoie C, et al. Three dimensional reciprocal space measurement by x-ray diffraction using linear and area detectors: applications to texture and defects determination in oriented thin films and nanoprecipitates. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A. 2013;31(2).
MLA
Gaudet, Simon, Koen De Keyser, Samuel Lambert-Milot, et al. “Three Dimensional Reciprocal Space Measurement by X-ray Diffraction Using Linear and Area Detectors: Applications to Texture and Defects Determination in Oriented Thin Films and Nanoprecipitates.” JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A 31.2 (2013): n. pag. Print.
@article{3231874,
  articleno    = {021505},
  author       = {Gaudet, Simon and De Keyser, Koen and Lambert-Milot, Samuel and Jordan-Sweet, Jean and Detavernier, Christophe and Lavoie, Christian and Desjardins, Patrick},
  issn         = {0734-2101},
  journal      = {JOURNAL OF VACUUM SCIENCE \& TECHNOLOGY A},
  language     = {eng},
  number       = {2},
  pages        = {13},
  title        = {Three dimensional reciprocal space measurement by x-ray diffraction using linear and area detectors: applications to texture and defects determination in oriented thin films and nanoprecipitates},
  url          = {http://dx.doi.org/10.1116/1.4789984},
  volume       = {31},
  year         = {2013},
}

Altmetric
View in Altmetric
Web of Science
Times cited: