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Double-Sampling Sigma Delta ADC`s with Bilinear Integrators

Pieter Rombouts (UGent) , Jeroen De Maeyer (UGent) and Ludo Weyten (UGent)
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Chicago
Rombouts, Pieter, Jeroen De Maeyer, and Ludo Weyten. 2004. “Double-Sampling Sigma Delta ADC`s with Bilinear Integrators.” In Proceedings of the 3rd WSEAS International Conference on Electronics, Control and Signal Processing (ICECS), 1–1.
APA
Rombouts, P., De Maeyer, J., & Weyten, L. (2004). Double-Sampling Sigma Delta ADC`s with Bilinear Integrators. Proceedings of the 3rd WSEAS International Conference on Electronics, Control and Signal Processing (ICECS) (pp. 1–1).
Vancouver
1.
Rombouts P, De Maeyer J, Weyten L. Double-Sampling Sigma Delta ADC`s with Bilinear Integrators. Proceedings of the 3rd WSEAS International Conference on Electronics, Control and Signal Processing (ICECS). 2004. p. 1–1.
MLA
Rombouts, Pieter, Jeroen De Maeyer, and Ludo Weyten. “Double-Sampling Sigma Delta ADC`s with Bilinear Integrators.” Proceedings of the 3rd WSEAS International Conference on Electronics, Control and Signal Processing (ICECS). 2004. 1–1. Print.
@inproceedings{319591,
  author       = {Rombouts, Pieter and De Maeyer, Jeroen and Weyten, Ludo},
  booktitle    = {Proceedings of the 3rd WSEAS International Conference on Electronics, Control and Signal Processing (ICECS)},
  pages        = {1--1},
  title        = {Double-Sampling Sigma Delta ADC`s with Bilinear Integrators},
  year         = {2004},
}