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Reliability of a stretchable interconnect utilizing terminated, in-plane meandered copper conductor

Michal Jablonski, Frederick Bossuyt UGent, Jan Vanfleteren UGent, Thomas Vervust UGent and Hans de Vries (2013) MICROELECTRONICS RELIABILITY. 53(7). p.956-963
Please use this url to cite or link to this publication:
author
organization
year
type
journalArticle (original)
publication status
published
subject
keyword
Reliability, SMI, Wearout, Conformability, Stretch-ability, Meandered metal track, PDMS, DESIGN, FABRICATION, CIRCUITS, Interconnect
journal title
MICROELECTRONICS RELIABILITY
volume
53
issue
7
pages
956 - 963
Web of Science type
Article
Web of Science id
000320841500005
JCR category
ENGINEERING, ELECTRICAL & ELECTRONIC
JCR impact factor
1.214 (2013)
JCR rank
124/248 (2013)
JCR quartile
2 (2013)
ISSN
0026-2714
DOI
10.1016/j.microrel.2013.04.002
project
EC-FP7-Place-It
language
English
UGent publication?
yes
classification
A1
copyright statement
I have transferred the copyright for this publication to the publisher
id
3060403
handle
http://hdl.handle.net/1854/LU-3060403
date created
2012-11-26 14:49:35
date last changed
2016-12-19 15:43:05
@article{3060403,
  author       = {Jablonski, Michal and Bossuyt, Frederick and Vanfleteren, Jan and Vervust, Thomas and de Vries, Hans},
  issn         = {0026-2714},
  journal      = {MICROELECTRONICS RELIABILITY},
  keyword      = {Reliability,SMI,Wearout,Conformability,Stretch-ability,Meandered metal track,PDMS,DESIGN,FABRICATION,CIRCUITS,Interconnect},
  language     = {eng},
  number       = {7},
  pages        = {956--963},
  title        = {Reliability of a stretchable interconnect utilizing terminated, in-plane meandered copper conductor},
  url          = {http://dx.doi.org/10.1016/j.microrel.2013.04.002},
  volume       = {53},
  year         = {2013},
}

Chicago
Jablonski, Michal, Frederick Bossuyt, Jan Vanfleteren, Thomas Vervust, and Hans de Vries. 2013. “Reliability of a Stretchable Interconnect Utilizing Terminated, In-plane Meandered Copper Conductor.” Microelectronics Reliability 53 (7): 956–963.
APA
Jablonski, M., Bossuyt, F., Vanfleteren, J., Vervust, T., & de Vries, H. (2013). Reliability of a stretchable interconnect utilizing terminated, in-plane meandered copper conductor. MICROELECTRONICS RELIABILITY, 53(7), 956–963.
Vancouver
1.
Jablonski M, Bossuyt F, Vanfleteren J, Vervust T, de Vries H. Reliability of a stretchable interconnect utilizing terminated, in-plane meandered copper conductor. MICROELECTRONICS RELIABILITY. 2013;53(7):956–63.
MLA
Jablonski, Michal, Frederick Bossuyt, Jan Vanfleteren, et al. “Reliability of a Stretchable Interconnect Utilizing Terminated, In-plane Meandered Copper Conductor.” MICROELECTRONICS RELIABILITY 53.7 (2013): 956–963. Print.