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Characterization of bulk microdefects in Ge single crystals

(2004) JOURNAL OF APPLIED PHYSICS. 96(11). p.6164-6168
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Chicago
Poelman, Dirk, O DE GRYSE, Nico De Roo, Olivier Janssens, Paul Clauws, W BRAS, IP DOLBNYA, and I ROMANDIC. 2004. “Characterization of Bulk Microdefects in Ge Single Crystals.” Journal of Applied Physics 96 (11): 6164–6168.
APA
Poelman, D., DE GRYSE, O., De Roo, N., Janssens, O., Clauws, P., BRAS, W., DOLBNYA, I., et al. (2004). Characterization of bulk microdefects in Ge single crystals. JOURNAL OF APPLIED PHYSICS, 96(11), 6164–6168.
Vancouver
1.
Poelman D, DE GRYSE O, De Roo N, Janssens O, Clauws P, BRAS W, et al. Characterization of bulk microdefects in Ge single crystals. JOURNAL OF APPLIED PHYSICS. AMER INST PHYSICS; 2004;96(11):6164–8.
MLA
Poelman, Dirk, O DE GRYSE, Nico De Roo, et al. “Characterization of Bulk Microdefects in Ge Single Crystals.” JOURNAL OF APPLIED PHYSICS 96.11 (2004): 6164–6168. Print.
@article{302431,
  author       = {Poelman, Dirk and DE GRYSE, O and De Roo, Nico and Janssens, Olivier and Clauws, Paul and BRAS, W and DOLBNYA, IP and ROMANDIC, I},
  issn         = {0021-8979},
  journal      = {JOURNAL OF APPLIED PHYSICS},
  language     = {eng},
  number       = {11},
  pages        = {6164--6168},
  publisher    = {AMER INST PHYSICS},
  title        = {Characterization of bulk microdefects in Ge single crystals},
  volume       = {96},
  year         = {2004},
}

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