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Reliable low-cost co-kriging modeling of microwave devices

Slawomir Koziel, Ivo Couckuyt UGent and Tom Dhaene UGent (2012) IEEE International Microwave Symposium, Proceedings. p.1-3
Please use this url to cite or link to this publication:
author
organization
year
type
conference
publication status
published
subject
keyword
IBCN
in
IEEE International Microwave Symposium, Proceedings
pages
1 - 3
publisher
IEEE
conference name
IEEE International Microwave Symposium (IMS - 2012)
conference location
Montréal, Canada
conference start
2012-06-17
conference end
2012-06-22
language
English
UGent publication?
yes
classification
C1
copyright statement
I have transferred the copyright for this publication to the publisher
id
3003831
handle
http://hdl.handle.net/1854/LU-3003831
date created
2012-10-02 10:55:23
date last changed
2012-10-08 10:18:25
@inproceedings{3003831,
  author       = {Koziel, Slawomir and Couckuyt, Ivo and Dhaene, Tom},
  booktitle    = {IEEE International Microwave Symposium, Proceedings},
  keyword      = {IBCN},
  language     = {eng},
  location     = {Montr{\'e}al, Canada},
  pages        = {1--3},
  publisher    = {IEEE},
  title        = {Reliable low-cost co-kriging modeling of microwave devices},
  year         = {2012},
}

Chicago
Koziel, Slawomir, Ivo Couckuyt, and Tom Dhaene. 2012. “Reliable Low-cost Co-kriging Modeling of Microwave Devices.” In IEEE International Microwave Symposium, Proceedings, 1–3. IEEE.
APA
Koziel, S., Couckuyt, I., & Dhaene, T. (2012). Reliable low-cost co-kriging modeling of microwave devices. IEEE International Microwave Symposium, Proceedings (pp. 1–3). Presented at the IEEE International Microwave Symposium (IMS - 2012), IEEE.
Vancouver
1.
Koziel S, Couckuyt I, Dhaene T. Reliable low-cost co-kriging modeling of microwave devices. IEEE International Microwave Symposium, Proceedings. IEEE; 2012. p. 1–3.
MLA
Koziel, Slawomir, Ivo Couckuyt, and Tom Dhaene. “Reliable Low-cost Co-kriging Modeling of Microwave Devices.” IEEE International Microwave Symposium, Proceedings. IEEE, 2012. 1–3. Print.