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Analysis of common-mode noise on on-chip differential lines through stochastic modeling of parameter variability

Dries Vande Ginste UGent, Daniël De Zutter UGent, Dirk Deschrijver UGent, Tom Dhaene UGent, Paolo Manfredi and Flavio Canavero (2012) IEEE International Symposium on Electromagnetic Compatibility. p.144-149
abstract
In this contribution a novel stochastic modeling strategy to analyze the influence of parameter variability on differential signaling over on-chip interconnects is presented. The method starts from an accurate computation of the differential line's per unit of length transmission line parameters, adopts a parameterized macromodeling scheme, and invokes the so-called stochastic Galerkin method (SGM). Parameter variability of the line itself and of the terminations are studied and compared to a traditional Monte Carlo (MC) approach, as such demonstrating excellent accuracy and efficiency of the proposed new technique. For the first time, an SGM is constructed for and applied to differential on-chip interconnects, and it is illustrated that this novel stochastic modeling strategy is very well suited to analyze common-mode noise induced by random imbalance of the line's terminations.
Please use this url to cite or link to this publication:
author
organization
year
type
conference
publication status
published
subject
keyword
FREQUENCY-DOMAIN, POLYNOMIAL CHAOS, INTERCONNECTS
in
IEEE International Symposium on Electromagnetic Compatibility
issue title
2012 IEEE INTERNATIONAL SYMPOSIUM ON ELECTROMAGNETIC COMPATIBILITY (EMC)
pages
144 - 149
publisher
IEEE
place of publication
Piscataway, NJ, USA
conference name
IEEE International Symposium on Electromagnetic Compatibility (EMC- 2012)
conference location
Pittsburgh, Pennsylvania, USA
conference start
2012-08-05
conference end
2012-08-10
Web of Science type
Proceedings Paper
Web of Science id
000316991700028
ISSN
2158-110X
ISBN
9781467320603
language
English
UGent publication?
yes
classification
P1
copyright statement
I have transferred the copyright for this publication to the publisher
id
2985326
handle
http://hdl.handle.net/1854/LU-2985326
date created
2012-09-12 11:12:04
date last changed
2013-06-04 15:29:50
@inproceedings{2985326,
  abstract     = {In this contribution a novel stochastic modeling strategy to analyze the influence of parameter variability on differential signaling over on-chip interconnects is presented. The method starts from an accurate computation of the differential line's per unit of length transmission line parameters, adopts a parameterized macromodeling scheme, and invokes the so-called stochastic Galerkin method (SGM). Parameter variability of the line itself and of the terminations are studied and compared to a traditional Monte Carlo (MC) approach, as such demonstrating excellent accuracy and efficiency of the proposed new technique. For the first time, an SGM is constructed for and applied to differential on-chip interconnects, and it is illustrated that this novel stochastic modeling strategy is very well suited to analyze common-mode noise induced by random imbalance of the line's terminations.},
  author       = {Vande Ginste, Dries and De Zutter, Dani{\"e}l and Deschrijver, Dirk and Dhaene, Tom and Manfredi, Paolo and Canavero, Flavio},
  booktitle    = {IEEE International Symposium on Electromagnetic Compatibility},
  isbn         = {9781467320603},
  issn         = {2158-110X},
  keyword      = {FREQUENCY-DOMAIN,POLYNOMIAL CHAOS,INTERCONNECTS},
  language     = {eng},
  location     = {Pittsburgh, Pennsylvania, USA},
  pages        = {144--149},
  publisher    = {IEEE},
  title        = {Analysis of common-mode noise on on-chip differential lines through stochastic modeling of parameter variability},
  year         = {2012},
}

Chicago
Vande Ginste, Dries, Daniël De Zutter, Dirk Deschrijver, Tom Dhaene, Paolo Manfredi, and Flavio Canavero. 2012. “Analysis of Common-mode Noise on On-chip Differential Lines Through Stochastic Modeling of Parameter Variability.” In IEEE International Symposium on Electromagnetic Compatibility, 144–149. Piscataway, NJ, USA: IEEE.
APA
Vande Ginste, D., De Zutter, D., Deschrijver, D., Dhaene, T., Manfredi, P., & Canavero, F. (2012). Analysis of common-mode noise on on-chip differential lines through stochastic modeling of parameter variability. IEEE International Symposium on Electromagnetic Compatibility (pp. 144–149). Presented at the IEEE International Symposium on Electromagnetic Compatibility (EMC- 2012), Piscataway, NJ, USA: IEEE.
Vancouver
1.
Vande Ginste D, De Zutter D, Deschrijver D, Dhaene T, Manfredi P, Canavero F. Analysis of common-mode noise on on-chip differential lines through stochastic modeling of parameter variability. IEEE International Symposium on Electromagnetic Compatibility. Piscataway, NJ, USA: IEEE; 2012. p. 144–9.
MLA
Vande Ginste, Dries, Daniël De Zutter, Dirk Deschrijver, et al. “Analysis of Common-mode Noise on On-chip Differential Lines Through Stochastic Modeling of Parameter Variability.” IEEE International Symposium on Electromagnetic Compatibility. Piscataway, NJ, USA: IEEE, 2012. 144–149. Print.