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A new methodology for RF-EMF exposure assessment based on sequential surrogate modeling

Sam Aerts UGent, Dirk Deschrijver UGent, Wout Joseph UGent, Leen Verloock UGent, Francis Goeminne UGent, Luc Martens UGent and Tom Dhaene UGent (2012) 7th International Workshop on Non Ionizing Radiation, Abstracts.
Please use this url to cite or link to this publication:
author
organization
year
type
conference
publication status
published
subject
keyword
IBCN
in
7th International Workshop on Non Ionizing Radiation, Abstracts
conference name
7th International Workshop on Non Ionizing Radiation (ICNIRP - 2012)
conference location
Edinburgh, UK
conference start
2012-05-09
conference end
2012-05-11
language
English
UGent publication?
yes
classification
C3
copyright statement
I have retained and own the full copyright for this publication
id
2985301
handle
http://hdl.handle.net/1854/LU-2985301
date created
2012-09-12 10:57:01
date last changed
2012-09-17 13:05:35
@inproceedings{2985301,
  author       = {Aerts, Sam and Deschrijver, Dirk and Joseph, Wout and Verloock, Leen and Goeminne, Francis and Martens, Luc and Dhaene, Tom},
  booktitle    = {7th International Workshop on Non Ionizing Radiation, Abstracts},
  keyword      = {IBCN},
  language     = {eng},
  location     = {Edinburgh, UK},
  title        = {A new methodology for RF-EMF exposure assessment based on sequential surrogate modeling},
  year         = {2012},
}

Chicago
Aerts, Sam, Dirk Deschrijver, Wout Joseph, Leen Verloock, Francis Goeminne, Luc Martens, and Tom Dhaene. 2012. “A New Methodology for RF-EMF Exposure Assessment Based on Sequential Surrogate Modeling.” In 7th International Workshop on Non Ionizing Radiation, Abstracts.
APA
Aerts, Sam, Deschrijver, D., Joseph, W., Verloock, L., Goeminne, F., Martens, L., & Dhaene, T. (2012). A new methodology for RF-EMF exposure assessment based on sequential surrogate modeling. 7th International Workshop on Non Ionizing Radiation, Abstracts. Presented at the 7th International Workshop on Non Ionizing Radiation (ICNIRP - 2012).
Vancouver
1.
Aerts S, Deschrijver D, Joseph W, Verloock L, Goeminne F, Martens L, et al. A new methodology for RF-EMF exposure assessment based on sequential surrogate modeling. 7th International Workshop on Non Ionizing Radiation, Abstracts. 2012.
MLA
Aerts, Sam, Dirk Deschrijver, Wout Joseph, et al. “A New Methodology for RF-EMF Exposure Assessment Based on Sequential Surrogate Modeling.” 7th International Workshop on Non Ionizing Radiation, Abstracts. 2012. Print.