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Automated near-field scanning algorithm for the EMC analysis of electronic devices

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Abstract
This paper presents an automated procedure to determine the electric ormagnetic near-field profile of electronic systems and devices in a given plane. It combines sequential sampling to determine the optimal coordinates of near-field scan points at arbitrary coordinates in the scanning plane. The effectiveness of the approach is illustrated by applying it to both a simulated and a measured printed circuit board example.
Keywords
Electromagnetic compatibility (EMC), IBCN, RECONSTRUCTION METHOD, CIRCUITS, Kriging, near-field (NF) scanning, sequential sampling, surrogate modeling

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Citation

Please use this url to cite or link to this publication:

MLA
Deschrijver, Dirk et al. “Automated Near-field Scanning Algorithm for the EMC Analysis of Electronic Devices.” IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY 54.3 (2012): 502–510. Print.
APA
Deschrijver, D., Vanhee, F., Pissoort, D., & Dhaene, T. (2012). Automated near-field scanning algorithm for the EMC analysis of electronic devices. IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY, 54(3), 502–510.
Chicago author-date
Deschrijver, Dirk, Filip Vanhee, Davy Pissoort, and Tom Dhaene. 2012. “Automated Near-field Scanning Algorithm for the EMC Analysis of Electronic Devices.” Ieee Transactions on Electromagnetic Compatibility 54 (3): 502–510.
Chicago author-date (all authors)
Deschrijver, Dirk, Filip Vanhee, Davy Pissoort, and Tom Dhaene. 2012. “Automated Near-field Scanning Algorithm for the EMC Analysis of Electronic Devices.” Ieee Transactions on Electromagnetic Compatibility 54 (3): 502–510.
Vancouver
1.
Deschrijver D, Vanhee F, Pissoort D, Dhaene T. Automated near-field scanning algorithm for the EMC analysis of electronic devices. IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY. 2012;54(3):502–10.
IEEE
[1]
D. Deschrijver, F. Vanhee, D. Pissoort, and T. Dhaene, “Automated near-field scanning algorithm for the EMC analysis of electronic devices,” IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY, vol. 54, no. 3, pp. 502–510, 2012.
@article{2983839,
  abstract     = {This paper presents an automated procedure to determine the electric ormagnetic near-field profile of electronic systems and devices in a given plane. It combines sequential sampling to determine the optimal coordinates of near-field scan points at arbitrary coordinates in the scanning plane. The effectiveness of the approach is illustrated by applying it to both a simulated and a measured printed circuit board example.},
  author       = {Deschrijver, Dirk and Vanhee, Filip and Pissoort, Davy and Dhaene, Tom},
  issn         = {0018-9375},
  journal      = {IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY},
  keywords     = {Electromagnetic compatibility (EMC),IBCN,RECONSTRUCTION METHOD,CIRCUITS,Kriging,near-field (NF) scanning,sequential sampling,surrogate modeling},
  language     = {eng},
  number       = {3},
  pages        = {502--510},
  title        = {Automated near-field scanning algorithm for the EMC analysis of electronic devices},
  url          = {http://dx.doi.org/10.1109/TEMC.2011.2163821},
  volume       = {54},
  year         = {2012},
}

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