Advanced search
1 file | 6.08 MB Add to list

3D stacking of ultrathin chip packages: an innovative packaging and interconnection technology

Swarnakamal Priyabadini (UGent) , Tom Sterken (UGent) , Luc Van Hoorebeke (UGent) and Jan Vanfleteren (UGent)
Author
Organization
Abstract
In order to increase the functionality of electronic devices, while reducing the overall size and weight of the electronic chip packages, electronic chip packages can be combined into a 3D assembly. In this field we present a technology for stacking of multiple chip packages, resulting in a total volume almost equal to that of a single bare die. The technology is based on batch-processed ultra-thin chip packages (UTCPs) with a fine pitch metal fan-out. Package-on-package (PoP) technology enables stacking of UTCPs by vacuum lamination, followed by through hole interconnection technology for making contacts to the metal fan-out of the embedded UTCPs within the stack. The individual chip packages can be tested before stacking.
Keywords
3D-stacking, Through hole interconnection, Multi-UTCP, EEPROM memory dies stacking, Vacuum lamination

Downloads

  • (...).pdf
    • full text
    • |
    • UGent only
    • |
    • PDF
    • |
    • 6.08 MB

Citation

Please use this url to cite or link to this publication:

MLA
Priyabadini, Swarnakamal, et al. “3D Stacking of Ultrathin Chip Packages: An Innovative Packaging and Interconnection Technology.” IEEE TRANSACTIONS ON COMPONENTS PACKAGING AND MANUFACTURING TECHNOLOGY, vol. 3, no. 7, 2013, pp. 1114–22, doi:10.1109/TCPMT.2012.2234830.
APA
Priyabadini, S., Sterken, T., Van Hoorebeke, L., & Vanfleteren, J. (2013). 3D stacking of ultrathin chip packages: an innovative packaging and interconnection technology. IEEE TRANSACTIONS ON COMPONENTS PACKAGING AND MANUFACTURING TECHNOLOGY, 3(7), 1114–1122. https://doi.org/10.1109/TCPMT.2012.2234830
Chicago author-date
Priyabadini, Swarnakamal, Tom Sterken, Luc Van Hoorebeke, and Jan Vanfleteren. 2013. “3D Stacking of Ultrathin Chip Packages: An Innovative Packaging and Interconnection Technology.” IEEE TRANSACTIONS ON COMPONENTS PACKAGING AND MANUFACTURING TECHNOLOGY 3 (7): 1114–22. https://doi.org/10.1109/TCPMT.2012.2234830.
Chicago author-date (all authors)
Priyabadini, Swarnakamal, Tom Sterken, Luc Van Hoorebeke, and Jan Vanfleteren. 2013. “3D Stacking of Ultrathin Chip Packages: An Innovative Packaging and Interconnection Technology.” IEEE TRANSACTIONS ON COMPONENTS PACKAGING AND MANUFACTURING TECHNOLOGY 3 (7): 1114–1122. doi:10.1109/TCPMT.2012.2234830.
Vancouver
1.
Priyabadini S, Sterken T, Van Hoorebeke L, Vanfleteren J. 3D stacking of ultrathin chip packages: an innovative packaging and interconnection technology. IEEE TRANSACTIONS ON COMPONENTS PACKAGING AND MANUFACTURING TECHNOLOGY. 2013;3(7):1114–22.
IEEE
[1]
S. Priyabadini, T. Sterken, L. Van Hoorebeke, and J. Vanfleteren, “3D stacking of ultrathin chip packages: an innovative packaging and interconnection technology,” IEEE TRANSACTIONS ON COMPONENTS PACKAGING AND MANUFACTURING TECHNOLOGY, vol. 3, no. 7, pp. 1114–1122, 2013.
@article{2973380,
  abstract     = {{In order to increase the functionality of electronic devices, while reducing the overall size and weight of the electronic chip packages, electronic chip packages can be combined into a 3D assembly. In this field we present a technology for stacking of multiple chip packages, resulting in a total volume almost equal to that of a single bare die. The technology is based on batch-processed ultra-thin chip packages (UTCPs) with a fine pitch metal fan-out. Package-on-package (PoP) technology enables stacking of UTCPs by vacuum lamination, followed by through hole interconnection technology for making contacts to the metal fan-out of the embedded UTCPs within the stack. The individual chip packages can be tested before stacking.}},
  author       = {{Priyabadini, Swarnakamal and Sterken, Tom and Van Hoorebeke, Luc and Vanfleteren, Jan}},
  issn         = {{2156-3950}},
  journal      = {{IEEE TRANSACTIONS ON COMPONENTS PACKAGING AND MANUFACTURING TECHNOLOGY}},
  keywords     = {{3D-stacking,Through hole interconnection,Multi-UTCP,EEPROM memory dies stacking,Vacuum lamination}},
  language     = {{eng}},
  number       = {{7}},
  pages        = {{1114--1122}},
  title        = {{3D stacking of ultrathin chip packages: an innovative packaging and interconnection technology}},
  url          = {{http://doi.org/10.1109/TCPMT.2012.2234830}},
  volume       = {{3}},
  year         = {{2013}},
}

Altmetric
View in Altmetric
Web of Science
Times cited: