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Combining Similarity Measures and Inclusion Measures for the Design of Image Quality Measures

Dietrich Van der Weken (UGent) , Mike Nachtegael (UGent) and Etienne Kerre (UGent)
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Chicago
Van der Weken, Dietrich, Mike Nachtegael, and Etienne Kerre. 2003. “Combining Similarity Measures and Inclusion Measures for the Design of Image Quality Measures.” In Proceedings of the 5th International Workshop on Fuzzy Logic and Applications (WILF 2003), 63–66.
APA
Van der Weken, Dietrich, Nachtegael, M., & Kerre, E. (2003). Combining Similarity Measures and Inclusion Measures for the Design of Image Quality Measures. Proceedings of the 5th International Workshop on Fuzzy Logic and Applications (WILF 2003) (pp. 63–66).
Vancouver
1.
Van der Weken D, Nachtegael M, Kerre E. Combining Similarity Measures and Inclusion Measures for the Design of Image Quality Measures. Proceedings of the 5th International Workshop on Fuzzy Logic and Applications (WILF 2003). 2003. p. 63–6.
MLA
Van der Weken, Dietrich, Mike Nachtegael, and Etienne Kerre. “Combining Similarity Measures and Inclusion Measures for the Design of Image Quality Measures.” Proceedings of the 5th International Workshop on Fuzzy Logic and Applications (WILF 2003). 2003. 63–66. Print.
@inproceedings{297131,
  author       = {Van der Weken, Dietrich and Nachtegael, Mike and Kerre, Etienne},
  booktitle    = {Proceedings of the 5th International Workshop on Fuzzy Logic and Applications (WILF 2003)},
  pages        = {63--66},
  title        = {Combining Similarity Measures and Inclusion Measures for the Design of Image Quality Measures},
  year         = {2003},
}