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Feasibility study of the application of micro-Raman imaging as complement to micro-XRF imaging

Annelien Deneckere UGent, Bart Vekemans UGent, Lien Van de Voorde UGent, Paul De Paepe UGent, Laszlo Vincze UGent, Luc Moens UGent and Peter Vandenabeele UGent (2012) APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING. 106(2). p.363-376
abstract
X-ray fluorescence (XRF) spectroscopy and Raman spectroscopy are preferential analytical techniques to study cultural heritage objects, since both techniques may provide complementary information in a non-destructive manner. Moreover, the application of microscopic beams allows the investigation of heterogeneous samples on the microscopic level and the study of the heterogeneity of particular samples. The micro-XRF method became already a routine analytical imaging method also because of the well-established spectrum evaluation methodology enabling specific data handling procedures. These include multivariate statistical analysis procedures such as principal components analysis (PCA) in order to explore and describe the acquired data, and clustering techniques in order to find similar pixels (or areas) in the obtained images. In the case of the micro-Raman technique, however, the usual approach is to perform a single spot analysis of only a few selected positions in order to ultimately identify the material on the basis of the comparison with Raman spectra obtained from reference materials. However, when samples are heterogeneous, imaging is still to be preferred in order to deal with the problem of sampling. With the arrival of a new micro-Raman spectrometer at the UGent laboratories, there was the need to explore the possibilities of Raman imaging. One of the most important aspects of imaging is the time needed for the analysis. Therefore, the influence of different instrumental parameters, such as resolution (low or high) and measuring time per pixel, on the quality of Raman spectra and images was investigated in order to evaluate the possibility of performing fast Raman mappings because of the need to identify the regions of interest on the art object in a more systematic manner.
Please use this url to cite or link to this publication:
author
organization
year
type
journalArticle (original)
publication status
published
subject
keyword
WORKS-OF-ART, RAY-FLUORESCENCE SPECTROMETER, WALL PAINTINGS, NONDESTRUCTIVE ANALYSIS, ROCK-ART, ILLUMINATED MANUSCRIPTS, SPECTROSCOPIC ANALYSIS, CULTURAL-HERITAGE, PIGMENT ANALYSIS, CROSS-SECTIONS
journal title
APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING
Appl. Phys. A-Mater. Sci. Process.
volume
106
issue
2
pages
363 - 376
Web of Science type
Article
Web of Science id
000299749000008
JCR category
MATERIALS SCIENCE, MULTIDISCIPLINARY
JCR impact factor
1.545 (2012)
JCR rank
93/239 (2012)
JCR quartile
2 (2012)
ISSN
0947-8396
DOI
10.1007/s00339-011-6693-5
language
English
UGent publication?
yes
classification
A1
copyright statement
I have transferred the copyright for this publication to the publisher
id
2962656
handle
http://hdl.handle.net/1854/LU-2962656
date created
2012-07-13 11:42:12
date last changed
2012-07-30 09:36:42
@article{2962656,
  abstract     = {X-ray fluorescence (XRF) spectroscopy and Raman spectroscopy are preferential analytical techniques to study cultural heritage objects, since both techniques may provide complementary information in a non-destructive manner. Moreover, the application of microscopic beams allows the investigation of heterogeneous samples on the microscopic level and the study of the heterogeneity of particular samples. The micro-XRF method became already a routine analytical imaging method also because of the well-established spectrum evaluation methodology enabling specific data handling procedures. These include multivariate statistical analysis procedures such as principal components analysis (PCA) in order to explore and describe the acquired data, and clustering techniques in order to find similar pixels (or areas) in the obtained images. In the case of the micro-Raman technique, however, the usual approach is to perform a single spot analysis of only a few selected positions in order to ultimately identify the material on the basis of the comparison with Raman spectra obtained from reference materials. However, when samples are heterogeneous, imaging is still to be preferred in order to deal with the problem of sampling. With the arrival of a new micro-Raman spectrometer at the UGent laboratories, there was the need to explore the possibilities of Raman imaging. One of the most important aspects of imaging is the time needed for the analysis. Therefore, the influence of different instrumental parameters, such as resolution (low or high) and measuring time per pixel, on the quality of Raman spectra and images was investigated in order to evaluate the possibility of performing fast Raman mappings because of the need to identify the regions of interest on the art object in a more systematic manner.},
  author       = {Deneckere, Annelien and Vekemans, Bart and Van de Voorde, Lien and De Paepe, Paul and Vincze, Laszlo and Moens, Luc and Vandenabeele, Peter},
  issn         = {0947-8396},
  journal      = {APPLIED PHYSICS A-MATERIALS SCIENCE \& PROCESSING},
  keyword      = {WORKS-OF-ART,RAY-FLUORESCENCE SPECTROMETER,WALL PAINTINGS,NONDESTRUCTIVE ANALYSIS,ROCK-ART,ILLUMINATED MANUSCRIPTS,SPECTROSCOPIC ANALYSIS,CULTURAL-HERITAGE,PIGMENT ANALYSIS,CROSS-SECTIONS},
  language     = {eng},
  number       = {2},
  pages        = {363--376},
  title        = {Feasibility study of the application of micro-Raman imaging as complement to micro-XRF imaging},
  url          = {http://dx.doi.org/10.1007/s00339-011-6693-5},
  volume       = {106},
  year         = {2012},
}

Chicago
Deneckere, Annelien, Bart Vekemans, Lien Van de Voorde, Paul De Paepe, Laszlo Vincze, Luc Moens, and Peter Vandenabeele. 2012. “Feasibility Study of the Application of micro-Raman Imaging as Complement to micro-XRF Imaging.” Applied Physics A-materials Science & Processing 106 (2): 363–376.
APA
Deneckere, A., Vekemans, B., Van de Voorde, L., De Paepe, P., Vincze, L., Moens, L., & Vandenabeele, P. (2012). Feasibility study of the application of micro-Raman imaging as complement to micro-XRF imaging. APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 106(2), 363–376.
Vancouver
1.
Deneckere A, Vekemans B, Van de Voorde L, De Paepe P, Vincze L, Moens L, et al. Feasibility study of the application of micro-Raman imaging as complement to micro-XRF imaging. APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING. 2012;106(2):363–76.
MLA
Deneckere, Annelien, Bart Vekemans, Lien Van de Voorde, et al. “Feasibility Study of the Application of micro-Raman Imaging as Complement to micro-XRF Imaging.” APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING 106.2 (2012): 363–376. Print.