Advanced search
1 file | 4.93 MB Add to list

Feasibility study of the application of micro-Raman imaging as complement to micro-XRF imaging

Author
Organization
Abstract
X-ray fluorescence (XRF) spectroscopy and Raman spectroscopy are preferential analytical techniques to study cultural heritage objects, since both techniques may provide complementary information in a non-destructive manner. Moreover, the application of microscopic beams allows the investigation of heterogeneous samples on the microscopic level and the study of the heterogeneity of particular samples. The micro-XRF method became already a routine analytical imaging method also because of the well-established spectrum evaluation methodology enabling specific data handling procedures. These include multivariate statistical analysis procedures such as principal components analysis (PCA) in order to explore and describe the acquired data, and clustering techniques in order to find similar pixels (or areas) in the obtained images. In the case of the micro-Raman technique, however, the usual approach is to perform a single spot analysis of only a few selected positions in order to ultimately identify the material on the basis of the comparison with Raman spectra obtained from reference materials. However, when samples are heterogeneous, imaging is still to be preferred in order to deal with the problem of sampling. With the arrival of a new micro-Raman spectrometer at the UGent laboratories, there was the need to explore the possibilities of Raman imaging. One of the most important aspects of imaging is the time needed for the analysis. Therefore, the influence of different instrumental parameters, such as resolution (low or high) and measuring time per pixel, on the quality of Raman spectra and images was investigated in order to evaluate the possibility of performing fast Raman mappings because of the need to identify the regions of interest on the art object in a more systematic manner.
Keywords
RAY-FLUORESCENCE SPECTROMETER, WORKS-OF-ART, WALL PAINTINGS, NONDESTRUCTIVE ANALYSIS, ROCK-ART, ILLUMINATED MANUSCRIPTS, SPECTROSCOPIC ANALYSIS, CULTURAL-HERITAGE, PIGMENT ANALYSIS, CROSS-SECTIONS

Downloads

  • (...).pdf
    • full text
    • |
    • UGent only
    • |
    • PDF
    • |
    • 4.93 MB

Citation

Please use this url to cite or link to this publication:

MLA
Deneckere, Annelien, et al. “Feasibility Study of the Application of Micro-Raman Imaging as Complement to Micro-XRF Imaging.” APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, vol. 106, no. 2, 2012, pp. 363–76, doi:10.1007/s00339-011-6693-5.
APA
Deneckere, A., Vekemans, B., Van de Voorde, L., De Paepe, P., Vincze, L., Moens, L., & Vandenabeele, P. (2012). Feasibility study of the application of micro-Raman imaging as complement to micro-XRF imaging. APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 106(2), 363–376. https://doi.org/10.1007/s00339-011-6693-5
Chicago author-date
Deneckere, Annelien, Bart Vekemans, Lien Van de Voorde, Paul De Paepe, Laszlo Vincze, Luc Moens, and Peter Vandenabeele. 2012. “Feasibility Study of the Application of Micro-Raman Imaging as Complement to Micro-XRF Imaging.” APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING 106 (2): 363–76. https://doi.org/10.1007/s00339-011-6693-5.
Chicago author-date (all authors)
Deneckere, Annelien, Bart Vekemans, Lien Van de Voorde, Paul De Paepe, Laszlo Vincze, Luc Moens, and Peter Vandenabeele. 2012. “Feasibility Study of the Application of Micro-Raman Imaging as Complement to Micro-XRF Imaging.” APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING 106 (2): 363–376. doi:10.1007/s00339-011-6693-5.
Vancouver
1.
Deneckere A, Vekemans B, Van de Voorde L, De Paepe P, Vincze L, Moens L, et al. Feasibility study of the application of micro-Raman imaging as complement to micro-XRF imaging. APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING. 2012;106(2):363–76.
IEEE
[1]
A. Deneckere et al., “Feasibility study of the application of micro-Raman imaging as complement to micro-XRF imaging,” APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, vol. 106, no. 2, pp. 363–376, 2012.
@article{2962656,
  abstract     = {{X-ray fluorescence (XRF) spectroscopy and Raman spectroscopy are preferential analytical techniques to study cultural heritage objects, since both techniques may provide complementary information in a non-destructive manner. Moreover, the application of microscopic beams allows the investigation of heterogeneous samples on the microscopic level and the study of the heterogeneity of particular samples. The micro-XRF method became already a routine analytical imaging method also because of the well-established spectrum evaluation methodology enabling specific data handling procedures. These include multivariate statistical analysis procedures such as principal components analysis (PCA) in order to explore and describe the acquired data, and clustering techniques in order to find similar pixels (or areas) in the obtained images. In the case of the micro-Raman technique, however, the usual approach is to perform a single spot analysis of only a few selected positions in order to ultimately identify the material on the basis of the comparison with Raman spectra obtained from reference materials. However, when samples are heterogeneous, imaging is still to be preferred in order to deal with the problem of sampling. With the arrival of a new micro-Raman spectrometer at the UGent laboratories, there was the need to explore the possibilities of Raman imaging. One of the most important aspects of imaging is the time needed for the analysis. Therefore, the influence of different instrumental parameters, such as resolution (low or high) and measuring time per pixel, on the quality of Raman spectra and images was investigated in order to evaluate the possibility of performing fast Raman mappings because of the need to identify the regions of interest on the art object in a more systematic manner.}},
  author       = {{Deneckere, Annelien and Vekemans, Bart and Van de Voorde, Lien and De Paepe, Paul and Vincze, Laszlo and Moens, Luc and Vandenabeele, Peter}},
  issn         = {{0947-8396}},
  journal      = {{APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING}},
  keywords     = {{RAY-FLUORESCENCE SPECTROMETER,WORKS-OF-ART,WALL PAINTINGS,NONDESTRUCTIVE ANALYSIS,ROCK-ART,ILLUMINATED MANUSCRIPTS,SPECTROSCOPIC ANALYSIS,CULTURAL-HERITAGE,PIGMENT ANALYSIS,CROSS-SECTIONS}},
  language     = {{eng}},
  number       = {{2}},
  pages        = {{363--376}},
  title        = {{Feasibility study of the application of micro-Raman imaging as complement to micro-XRF imaging}},
  url          = {{http://dx.doi.org/10.1007/s00339-011-6693-5}},
  volume       = {{106}},
  year         = {{2012}},
}

Altmetric
View in Altmetric
Web of Science
Times cited: