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Frequency and time domain variability analysis of an on-chip inverted embedded microstrip line using a macromodeling-based stochastic galerkin method

Dries Vande Ginste UGent, Daniël De Zutter UGent, Dirk Deschrijver UGent, Tom Dhaene UGent, Paolo Manfredi and Flavio Canavero (2012) IEEE 16th Workshop on Signal and Power Integrity, Proceedings. p.85-88
Please use this url to cite or link to this publication:
author
organization
year
type
conference
publication status
published
subject
keyword
IBCN
in
IEEE 16th Workshop on Signal and Power Integrity, Proceedings
pages
85 - 88
publisher
IEEE
place of publication
Piscataway, NJ, USA
conference name
IEEE 16th Workshop on Signal and Power Integrity (SPI - 2012)
conference location
Sorrento, Italy
conference start
2012-05-13
conference end
2012-05-16
ISBN
9781467315029
language
English
UGent publication?
yes
classification
C1
copyright statement
I have transferred the copyright for this publication to the publisher
id
2957009
handle
http://hdl.handle.net/1854/LU-2957009
date created
2012-07-06 11:12:08
date last changed
2012-07-09 13:11:25
@inproceedings{2957009,
  author       = {Vande Ginste, Dries and De Zutter, Dani{\"e}l and Deschrijver, Dirk and Dhaene, Tom and Manfredi, Paolo and Canavero, Flavio},
  booktitle    = {IEEE 16th Workshop on Signal and Power Integrity, Proceedings},
  isbn         = {9781467315029},
  keyword      = {IBCN},
  language     = {eng},
  location     = {Sorrento, Italy},
  pages        = {85--88},
  publisher    = {IEEE},
  title        = {Frequency and time domain variability analysis of an on-chip inverted embedded microstrip line using a macromodeling-based stochastic galerkin method},
  year         = {2012},
}

Chicago
Vande Ginste, Dries, Daniël De Zutter, Dirk Deschrijver, Tom Dhaene, Paolo Manfredi, and Flavio Canavero. 2012. “Frequency and Time Domain Variability Analysis of an On-chip Inverted Embedded Microstrip Line Using a Macromodeling-based Stochastic Galerkin Method.” In IEEE 16th Workshop on Signal and Power Integrity, Proceedings, 85–88. Piscataway, NJ, USA: IEEE.
APA
Vande Ginste, D., De Zutter, D., Deschrijver, D., Dhaene, T., Manfredi, P., & Canavero, F. (2012). Frequency and time domain variability analysis of an on-chip inverted embedded microstrip line using a macromodeling-based stochastic galerkin method. IEEE 16th Workshop on Signal and Power Integrity, Proceedings (pp. 85–88). Presented at the IEEE 16th Workshop on Signal and Power Integrity (SPI - 2012), Piscataway, NJ, USA: IEEE.
Vancouver
1.
Vande Ginste D, De Zutter D, Deschrijver D, Dhaene T, Manfredi P, Canavero F. Frequency and time domain variability analysis of an on-chip inverted embedded microstrip line using a macromodeling-based stochastic galerkin method. IEEE 16th Workshop on Signal and Power Integrity, Proceedings. Piscataway, NJ, USA: IEEE; 2012. p. 85–8.
MLA
Vande Ginste, Dries, Daniël De Zutter, Dirk Deschrijver, et al. “Frequency and Time Domain Variability Analysis of an On-chip Inverted Embedded Microstrip Line Using a Macromodeling-based Stochastic Galerkin Method.” IEEE 16th Workshop on Signal and Power Integrity, Proceedings. Piscataway, NJ, USA: IEEE, 2012. 85–88. Print.