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Double-sampling extended-counting ADC

Jeroen De Maeyer (UGent) , Pieter Rombouts (UGent) and Ludo Weyten (UGent)
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Chicago
De Maeyer, Jeroen, Pieter Rombouts, and Ludo Weyten. 2004. “Double-sampling Extended-counting ADC.” Ieee Journal of Solid-state Circuits 39 (3): 411–418.
APA
De Maeyer, Jeroen, Rombouts, P., & Weyten, L. (2004). Double-sampling extended-counting ADC. IEEE JOURNAL OF SOLID-STATE CIRCUITS, 39(3), 411–418.
Vancouver
1.
De Maeyer J, Rombouts P, Weyten L. Double-sampling extended-counting ADC. IEEE JOURNAL OF SOLID-STATE CIRCUITS. IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC; 2004;39(3):411–8.
MLA
De Maeyer, Jeroen, Pieter Rombouts, and Ludo Weyten. “Double-sampling Extended-counting ADC.” IEEE JOURNAL OF SOLID-STATE CIRCUITS 39.3 (2004): 411–418. Print.
@article{289367,
  author       = {De Maeyer, Jeroen and Rombouts, Pieter and Weyten, Ludo},
  issn         = {0018-9200},
  journal      = {IEEE JOURNAL OF SOLID-STATE CIRCUITS},
  language     = {eng},
  number       = {3},
  pages        = {411--418},
  publisher    = {IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC},
  title        = {Double-sampling extended-counting ADC},
  volume       = {39},
  year         = {2004},
}

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