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Near-field scanner for the accurate characterization of electromagnetic fields in the close vicinity of electronic devices and systems.

Kurt Haelvoet, Steven Criel, F DOBBELAERE, Luc Martens (UGent) , Pascal De Langhe and R DE SMEDT
(1996) Proc. of the IEEE Instrumentation and Measurement Technology Conference & IMEKO Technical Committee 7, Vol. 2, 4-6 June Brussels, Belgium, pp. 1119-1123.
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Citation

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MLA
Haelvoet, Kurt, et al. “Near-Field Scanner for the Accurate Characterization of Electromagnetic Fields in the Close Vicinity of Electronic Devices and Systems.” Proc. of the IEEE Instrumentation and Measurement Technology Conference & IMEKO Technical Committee 7, Vol. 2, 4-6 June Brussels, Belgium, Pp. 1119-1123, 1996.
APA
Haelvoet, K., Criel, S., DOBBELAERE, F., Martens, L., De Langhe, P., & DE SMEDT, R. (1996). Near-field scanner for the accurate characterization of electromagnetic fields in the close vicinity of electronic devices and systems. Proc. of the IEEE Instrumentation and Measurement Technology Conference & IMEKO Technical Committee 7, Vol. 2, 4-6 June Brussels, Belgium, Pp. 1119-1123.
Chicago author-date
Haelvoet, Kurt, Steven Criel, F DOBBELAERE, Luc Martens, Pascal De Langhe, and R DE SMEDT. 1996. “Near-Field Scanner for the Accurate Characterization of Electromagnetic Fields in the Close Vicinity of Electronic Devices and Systems.” In Proc. of the IEEE Instrumentation and Measurement Technology Conference & IMEKO Technical Committee 7, Vol. 2, 4-6 June Brussels, Belgium, Pp. 1119-1123.
Chicago author-date (all authors)
Haelvoet, Kurt, Steven Criel, F DOBBELAERE, Luc Martens, Pascal De Langhe, and R DE SMEDT. 1996. “Near-Field Scanner for the Accurate Characterization of Electromagnetic Fields in the Close Vicinity of Electronic Devices and Systems.” In Proc. of the IEEE Instrumentation and Measurement Technology Conference & IMEKO Technical Committee 7, Vol. 2, 4-6 June Brussels, Belgium, Pp. 1119-1123.
Vancouver
1.
Haelvoet K, Criel S, DOBBELAERE F, Martens L, De Langhe P, DE SMEDT R. Near-field scanner for the accurate characterization of electromagnetic fields in the close vicinity of electronic devices and systems. In: Proc of the IEEE Instrumentation and Measurement Technology Conference & IMEKO Technical Committee 7, Vol 2, 4-6 June Brussels, Belgium, pp 1119-1123. 1996.
IEEE
[1]
K. Haelvoet, S. Criel, F. DOBBELAERE, L. Martens, P. De Langhe, and R. DE SMEDT, “Near-field scanner for the accurate characterization of electromagnetic fields in the close vicinity of electronic devices and systems.,” in Proc. of the IEEE Instrumentation and Measurement Technology Conference & IMEKO Technical Committee 7, Vol. 2, 4-6 June Brussels, Belgium, pp. 1119-1123, 1996.
@inproceedings{263713,
  author       = {{Haelvoet, Kurt and Criel, Steven and DOBBELAERE, F and Martens, Luc and De Langhe, Pascal and DE SMEDT, R}},
  booktitle    = {{Proc. of the IEEE Instrumentation and Measurement Technology Conference & IMEKO Technical Committee 7, Vol. 2, 4-6 June Brussels, Belgium, pp. 1119-1123}},
  language     = {{eng}},
  title        = {{Near-field scanner for the accurate characterization of electromagnetic fields in the close vicinity of electronic devices and systems.}},
  year         = {{1996}},
}