Near-field scanner for the accurate characterization of electromagnetic fields in the close vicinity of electronic devices and systems.
- Author
- Kurt Haelvoet, Steven Criel, F DOBBELAERE, Luc Martens (UGent) , Pascal De Langhe and R DE SMEDT
- Organization
Citation
Please use this url to cite or link to this publication: http://hdl.handle.net/1854/LU-263713
- MLA
- Haelvoet, Kurt, et al. “Near-Field Scanner for the Accurate Characterization of Electromagnetic Fields in the Close Vicinity of Electronic Devices and Systems.” Proc. of the IEEE Instrumentation and Measurement Technology Conference & IMEKO Technical Committee 7, Vol. 2, 4-6 June Brussels, Belgium, Pp. 1119-1123, 1996.
- APA
- Haelvoet, K., Criel, S., DOBBELAERE, F., Martens, L., De Langhe, P., & DE SMEDT, R. (1996). Near-field scanner for the accurate characterization of electromagnetic fields in the close vicinity of electronic devices and systems. Proc. of the IEEE Instrumentation and Measurement Technology Conference & IMEKO Technical Committee 7, Vol. 2, 4-6 June Brussels, Belgium, Pp. 1119-1123.
- Chicago author-date
- Haelvoet, Kurt, Steven Criel, F DOBBELAERE, Luc Martens, Pascal De Langhe, and R DE SMEDT. 1996. “Near-Field Scanner for the Accurate Characterization of Electromagnetic Fields in the Close Vicinity of Electronic Devices and Systems.” In Proc. of the IEEE Instrumentation and Measurement Technology Conference & IMEKO Technical Committee 7, Vol. 2, 4-6 June Brussels, Belgium, Pp. 1119-1123.
- Chicago author-date (all authors)
- Haelvoet, Kurt, Steven Criel, F DOBBELAERE, Luc Martens, Pascal De Langhe, and R DE SMEDT. 1996. “Near-Field Scanner for the Accurate Characterization of Electromagnetic Fields in the Close Vicinity of Electronic Devices and Systems.” In Proc. of the IEEE Instrumentation and Measurement Technology Conference & IMEKO Technical Committee 7, Vol. 2, 4-6 June Brussels, Belgium, Pp. 1119-1123.
- Vancouver
- 1.Haelvoet K, Criel S, DOBBELAERE F, Martens L, De Langhe P, DE SMEDT R. Near-field scanner for the accurate characterization of electromagnetic fields in the close vicinity of electronic devices and systems. In: Proc of the IEEE Instrumentation and Measurement Technology Conference & IMEKO Technical Committee 7, Vol 2, 4-6 June Brussels, Belgium, pp 1119-1123. 1996.
- IEEE
- [1]K. Haelvoet, S. Criel, F. DOBBELAERE, L. Martens, P. De Langhe, and R. DE SMEDT, “Near-field scanner for the accurate characterization of electromagnetic fields in the close vicinity of electronic devices and systems.,” in Proc. of the IEEE Instrumentation and Measurement Technology Conference & IMEKO Technical Committee 7, Vol. 2, 4-6 June Brussels, Belgium, pp. 1119-1123, 1996.
@inproceedings{263713, author = {{Haelvoet, Kurt and Criel, Steven and DOBBELAERE, F and Martens, Luc and De Langhe, Pascal and DE SMEDT, R}}, booktitle = {{Proc. of the IEEE Instrumentation and Measurement Technology Conference & IMEKO Technical Committee 7, Vol. 2, 4-6 June Brussels, Belgium, pp. 1119-1123}}, language = {{eng}}, title = {{Near-field scanner for the accurate characterization of electromagnetic fields in the close vicinity of electronic devices and systems.}}, year = {{1996}}, }