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Thickness Variations in LCD. Proc. of the SID Research Conf., pp. 419-422, 1993.

Arnout De Meyere, Erwin De Ley and Herman Pauwels (UGent)
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MLA
De Meyere, Arnout, Erwin De Ley, and Herman Pauwels. “Thickness Variations in LCD. Proc. of the SID Research Conf., Pp. 419-422, 1993.” Print.
APA
De Meyere, A., De Ley, E., & Pauwels, H. (n.d.). Thickness Variations in LCD. Proc. of the SID Research Conf., pp. 419-422, 1993.
Chicago author-date
De Meyere, Arnout, Erwin De Ley, and Herman Pauwels. “Thickness Variations in LCD. Proc. of the SID Research Conf., Pp. 419-422, 1993.” In .
Chicago author-date (all authors)
De Meyere, Arnout, Erwin De Ley, and Herman Pauwels. “Thickness Variations in LCD. Proc. of the SID Research Conf., Pp. 419-422, 1993.” In .
Vancouver
1.
De Meyere A, De Ley E, Pauwels H. Thickness Variations in LCD. Proc. of the SID Research Conf., pp. 419-422, 1993.
IEEE
[1]
A. De Meyere, E. De Ley, and H. Pauwels, “Thickness Variations in LCD. Proc. of the SID Research Conf., pp. 419-422, 1993.”
@inproceedings{237441,
  author       = {De Meyere, Arnout and De Ley, Erwin and Pauwels, Herman},
  language     = {eng},
  title        = {Thickness Variations in LCD. Proc. of the SID Research Conf., pp. 419-422, 1993.},
}