
Thickness Variations in LCD. Proc. of the SID Research Conf., pp. 419-422, 1993.
- Author
- Arnout De Meyere, Erwin De Ley and Herman Pauwels (UGent)
- Organization
Citation
Please use this url to cite or link to this publication: http://hdl.handle.net/1854/LU-237441
- MLA
- De Meyere, Arnout, et al. Thickness Variations in LCD. Proc. of the SID Research Conf., Pp. 419-422, 1993.
- APA
- De Meyere, A., De Ley, E., & Pauwels, H. (n.d.). Thickness Variations in LCD. Proc. of the SID Research Conf., pp. 419-422, 1993.
- Chicago author-date
- De Meyere, Arnout, Erwin De Ley, and Herman Pauwels. n.d. “Thickness Variations in LCD. Proc. of the SID Research Conf., Pp. 419-422, 1993.” In .
- Chicago author-date (all authors)
- De Meyere, Arnout, Erwin De Ley, and Herman Pauwels. “Thickness Variations in LCD. Proc. of the SID Research Conf., Pp. 419-422, 1993.” In .
- Vancouver
- 1.De Meyere A, De Ley E, Pauwels H. Thickness Variations in LCD. Proc. of the SID Research Conf., pp. 419-422, 1993. In.
- IEEE
- [1]A. De Meyere, E. De Ley, and H. Pauwels, “Thickness Variations in LCD. Proc. of the SID Research Conf., pp. 419-422, 1993.”
@inproceedings{237441, author = {{De Meyere, Arnout and De Ley, Erwin and Pauwels, Herman}}, language = {{eng}}, title = {{Thickness Variations in LCD. Proc. of the SID Research Conf., pp. 419-422, 1993.}}, }