Academic Bibliography

 Search 200 years of publications by Ghent University researchers.
Advanced search
Add to list
  1. Search results
  2. Thickness Variations in LCD. Proc. of...

Thickness Variations in LCD. Proc. of the SID Research Conf., pp. 419-422, 1993.

Arnout De Meyere, Erwin De Ley and Herman Pauwels (UGent)
Author
Organization

Citation

Please use this url to cite or link to this publication:

MLA
De Meyere, Arnout, et al. Thickness Variations in LCD. Proc. of the SID Research Conf., Pp. 419-422, 1993.
APA
De Meyere, A., De Ley, E., & Pauwels, H. (n.d.). Thickness Variations in LCD. Proc. of the SID Research Conf., pp. 419-422, 1993.
Chicago author-date
De Meyere, Arnout, Erwin De Ley, and Herman Pauwels. n.d. “Thickness Variations in LCD. Proc. of the SID Research Conf., Pp. 419-422, 1993.” In .
Chicago author-date (all authors)
De Meyere, Arnout, Erwin De Ley, and Herman Pauwels. “Thickness Variations in LCD. Proc. of the SID Research Conf., Pp. 419-422, 1993.” In .
Vancouver
1.
De Meyere A, De Ley E, Pauwels H. Thickness Variations in LCD. Proc. of the SID Research Conf., pp. 419-422, 1993. In.
IEEE
[1]
A. De Meyere, E. De Ley, and H. Pauwels, “Thickness Variations in LCD. Proc. of the SID Research Conf., pp. 419-422, 1993.”
@inproceedings{237441,
  author       = {{De Meyere, Arnout and De Ley, Erwin and Pauwels, Herman}},
  language     = {{eng}},
  title        = {{Thickness Variations in LCD. Proc. of the SID Research Conf., pp. 419-422, 1993.}},
}