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Measurement set-up for high-frequency characterization of planar contact de vices. 39th Automatic RF Techniques Group (ARFTG), Albuquerque, USA, Jun. 1992.

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Chicago
Degraeuwe, Peter, Luc Martens, and Daniël De Zutter. “Measurement Set-up for High-frequency Characterization of Planar Contact De Vices. 39th Automatic RF Techniques Group (ARFTG), Albuquerque, USA, Jun. 1992.”
APA
Degraeuwe, P., Martens, L., & De Zutter, D. (n.d.). Measurement set-up for high-frequency characterization of planar contact de vices. 39th Automatic RF Techniques Group (ARFTG), Albuquerque, USA, Jun. 1992.
Vancouver
1.
Degraeuwe P, Martens L, De Zutter D. Measurement set-up for high-frequency characterization of planar contact de vices. 39th Automatic RF Techniques Group (ARFTG), Albuquerque, USA, Jun. 1992.
MLA
Degraeuwe, Peter, Luc Martens, and Daniël De Zutter. “Measurement Set-up for High-frequency Characterization of Planar Contact De Vices. 39th Automatic RF Techniques Group (ARFTG), Albuquerque, USA, Jun. 1992.” n. pag. Print.
@misc{225885,
  author       = {Degraeuwe, Peter and Martens, Luc and De Zutter, Dani{\"e}l},
  language     = {eng},
  title        = {Measurement set-up for high-frequency characterization of planar contact de vices. 39th Automatic RF Techniques Group (ARFTG), Albuquerque, USA, Jun. 1992.},
}