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Measurement set-up for high-frequency characterization of planar contact de vices. 39th Automatic RF Techniques Group (ARFTG), Albuquerque, USA, Jun. 1992.

Peter Degraeuwe, Luc Martens UGent and Daniël De Zutter UGent
Please use this url to cite or link to this publication:
author
organization
type
misc
publication status
published
subject
language
English
UGent publication?
yes
classification
U
id
225885
handle
http://hdl.handle.net/1854/LU-225885
date created
2004-05-24 13:24:00
date last changed
2016-12-19 15:41:54
@misc{225885,
  author       = {Degraeuwe, Peter and Martens, Luc and De Zutter, Dani{\"e}l},
  language     = {eng},
  title        = {Measurement set-up for high-frequency characterization of planar contact de vices. 39th Automatic RF Techniques Group (ARFTG), Albuquerque, USA, Jun. 1992.},
}

Chicago
Degraeuwe, Peter, Luc Martens, and Daniël De Zutter. “Measurement Set-up for High-frequency Characterization of Planar Contact De Vices. 39th Automatic RF Techniques Group (ARFTG), Albuquerque, USA, Jun. 1992.”
APA
Degraeuwe, P., Martens, L., & De Zutter, D. (n.d.). Measurement set-up for high-frequency characterization of planar contact de vices. 39th Automatic RF Techniques Group (ARFTG), Albuquerque, USA, Jun. 1992.
Vancouver
1.
Degraeuwe P, Martens L, De Zutter D. Measurement set-up for high-frequency characterization of planar contact de vices. 39th Automatic RF Techniques Group (ARFTG), Albuquerque, USA, Jun. 1992.
MLA
Degraeuwe, Peter, Luc Martens, and Daniël De Zutter. “Measurement Set-up for High-frequency Characterization of Planar Contact De Vices. 39th Automatic RF Techniques Group (ARFTG), Albuquerque, USA, Jun. 1992.” n. pag. Print.