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Measurement set-up for high-frequency characterization of planar contact de vices. 39th Automatic RF Techniques Group (ARFTG), Albuquerque, USA, Jun. 1992.

(1992)
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Citation

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MLA
Degraeuwe, Peter, et al. Measurement Set-up for High-Frequency Characterization of Planar Contact de Vices. 39th Automatic RF Techniques Group (ARFTG), Albuquerque, USA, Jun. 1992. 1992.
APA
Degraeuwe, P., Martens, L., & De Zutter, D. (1992). Measurement set-up for high-frequency characterization of planar contact de vices. 39th Automatic RF Techniques Group (ARFTG), Albuquerque, USA, Jun. 1992.
Chicago author-date
Degraeuwe, Peter, Luc Martens, and Daniël De Zutter. 1992. “Measurement Set-up for High-Frequency Characterization of Planar Contact de Vices. 39th Automatic RF Techniques Group (ARFTG), Albuquerque, USA, Jun. 1992.”
Chicago author-date (all authors)
Degraeuwe, Peter, Luc Martens, and Daniël De Zutter. 1992. “Measurement Set-up for High-Frequency Characterization of Planar Contact de Vices. 39th Automatic RF Techniques Group (ARFTG), Albuquerque, USA, Jun. 1992.”
Vancouver
1.
Degraeuwe P, Martens L, De Zutter D. Measurement set-up for high-frequency characterization of planar contact de vices. 39th Automatic RF Techniques Group (ARFTG), Albuquerque, USA, Jun. 1992. 1992.
IEEE
[1]
P. Degraeuwe, L. Martens, and D. De Zutter, “Measurement set-up for high-frequency characterization of planar contact de vices. 39th Automatic RF Techniques Group (ARFTG), Albuquerque, USA, Jun. 1992.” 1992.
@misc{225885,
  author       = {{Degraeuwe, Peter and Martens, Luc and De Zutter, Daniël}},
  language     = {{eng}},
  title        = {{Measurement set-up for high-frequency characterization of planar contact de vices. 39th Automatic RF Techniques Group (ARFTG), Albuquerque, USA, Jun. 1992.}},
  year         = {{1992}},
}