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Two holographic methods for flatness testing with sub-wavelength or mul tiple wavelength sensitivity

Pierre Boone (UGent)
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Please use this url to cite or link to this publication:

MLA
Boone, Pierre. “Two Holographic Methods for Flatness Testing with Sub-wavelength or Mul Tiple Wavelength Sensitivity.” Technical Digest Summary Symposium on Optical Fabrication, Testing and Surface Evaluation, Fuji Film Hall, Ja Pan, 10-12.06.92, 8 P., 7 Figg. 1992. Print.
APA
Boone, P. (1992). Two holographic methods for flatness testing with sub-wavelength or mul tiple wavelength sensitivity. Technical Digest Summary Symposium on Optical Fabrication, Testing and Surface Evaluation, Fuji Film Hall, Ja pan, 10-12.06.92, 8 p., 7 figg.
Chicago author-date
Boone, Pierre. 1992. “Two Holographic Methods for Flatness Testing with Sub-wavelength or Mul Tiple Wavelength Sensitivity.” In Technical Digest Summary Symposium on Optical Fabrication, Testing and Surface Evaluation, Fuji Film Hall, Ja Pan, 10-12.06.92, 8 P., 7 Figg.
Chicago author-date (all authors)
Boone, Pierre. 1992. “Two Holographic Methods for Flatness Testing with Sub-wavelength or Mul Tiple Wavelength Sensitivity.” In Technical Digest Summary Symposium on Optical Fabrication, Testing and Surface Evaluation, Fuji Film Hall, Ja Pan, 10-12.06.92, 8 P., 7 Figg.
Vancouver
1.
Boone P. Two holographic methods for flatness testing with sub-wavelength or mul tiple wavelength sensitivity. Technical Digest Summary Symposium on Optical Fabrication, Testing and Surface Evaluation, Fuji Film Hall, Ja pan, 10-12.06.92, 8 p., 7 figg. 1992.
IEEE
[1]
P. Boone, “Two holographic methods for flatness testing with sub-wavelength or mul tiple wavelength sensitivity,” in Technical Digest Summary Symposium on Optical Fabrication, Testing and Surface Evaluation, Fuji Film Hall, Ja pan, 10-12.06.92, 8 p., 7 figg, 1992.
@inproceedings{225785,
  author       = {Boone, Pierre},
  booktitle    = {Technical Digest Summary Symposium on Optical Fabrication, Testing and Surface Evaluation, Fuji Film Hall, Ja pan, 10-12.06.92, 8 p., 7 figg},
  language     = {eng},
  title        = {Two holographic methods for flatness testing with sub-wavelength or mul tiple wavelength sensitivity},
  year         = {1992},
}