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Determination of slope and strain contours by double-exposure shearing interferometry

Pierre Boone (UGent)
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MLA
Boone, Pierre. “Determination of Slope and Strain Contours by Double-exposure Shearing Interferometry.” SPIE Milestone Series (Speckle Metrology), Vol. MS 35, pp. 453-460, 10 figg 1992 : n. pag. Print.
APA
Boone, P. (1992). Determination of slope and strain contours by double-exposure shearing interferometry. SPIE Milestone Series (Speckle Metrology), Vol. MS 35, pp. 453-460, 10 figg.
Chicago author-date
Boone, Pierre. 1992. “Determination of Slope and Strain Contours by Double-exposure Shearing Interferometry.” SPIE Milestone Series (Speckle Metrology), Vol. MS 35, Pp. 453-460, 10 Figg.
Chicago author-date (all authors)
Boone, Pierre. 1992. “Determination of Slope and Strain Contours by Double-exposure Shearing Interferometry.” SPIE Milestone Series (Speckle Metrology), Vol. MS 35, Pp. 453-460, 10 Figg.
Vancouver
1.
Boone P. Determination of slope and strain contours by double-exposure shearing interferometry. SPIE Milestone Series (Speckle Metrology), Vol. MS 35, pp. 453-460, 10 figg. 1992.
IEEE
[1]
P. Boone, “Determination of slope and strain contours by double-exposure shearing interferometry,” SPIE Milestone Series (Speckle Metrology), Vol. MS 35, pp. 453-460, 10 figg. 1992.
@misc{225783,
  author       = {Boone, Pierre},
  language     = {eng},
  series       = {SPIE Milestone Series (Speckle Metrology), Vol. MS 35, pp. 453-460, 10 figg},
  title        = {Determination of slope and strain contours by double-exposure shearing interferometry},
  year         = {1992},
}