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Anisotropie etching characteristics and etching efficiency of apatite: their significance for the FT dating techniques. Abstracts of the 7th Intern. Workshop on Fission-Track thermochronology Philadelphia, U.S.A., 13-17 July, 1992, p. 3.

R JONCKHEERE and Peter Van den haute UGent
Please use this url to cite or link to this publication:
author
organization
type
conference
publication status
published
subject
language
English
UGent publication?
yes
classification
C1
id
223050
handle
http://hdl.handle.net/1854/LU-223050
date created
2004-05-24 13:24:00
date last changed
2016-12-19 15:34:46
@inproceedings{223050,
  author       = {JONCKHEERE, R and Van den haute, Peter},
  language     = {eng},
  title        = {Anisotropie etching characteristics and etching efficiency of apatite: their significance for the FT dating techniques. Abstracts of the 7th Intern. Workshop on Fission-Track thermochronology Philadelphia, U.S.A., 13-17 July, 1992, p. 3.},
}

Chicago
JONCKHEERE, R, and Peter Van den haute. “Anisotropie Etching Characteristics and Etching Efficiency of Apatite: Their Significance for the FT Dating Techniques. Abstracts of the 7th Intern. Workshop on Fission-Track Thermochronology Philadelphia, U.S.A., 13-17 July, 1992, P. 3.” In .
APA
JONCKHEERE, R., & Van den haute, P. (n.d.). Anisotropie etching characteristics and etching efficiency of apatite: their significance for the FT dating techniques. Abstracts of the 7th Intern. Workshop on Fission-Track thermochronology Philadelphia, U.S.A., 13-17 July, 1992, p. 3.
Vancouver
1.
JONCKHEERE R, Van den haute P. Anisotropie etching characteristics and etching efficiency of apatite: their significance for the FT dating techniques. Abstracts of the 7th Intern. Workshop on Fission-Track thermochronology Philadelphia, U.S.A., 13-17 July, 1992, p. 3.
MLA
JONCKHEERE, R, and Peter Van den haute. “Anisotropie Etching Characteristics and Etching Efficiency of Apatite: Their Significance for the FT Dating Techniques. Abstracts of the 7th Intern. Workshop on Fission-Track Thermochronology Philadelphia, U.S.A., 13-17 July, 1992, P. 3.” Print.