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MLA
RAFI, J., et al. “Analysis of Thermal Donor Formation in N-Type CZ Silicon.” Analytical and Diagnostic Techniques for Semiconductor Materials, Devices and Processes, edited by B Kolbesen et al., The Electrochemical Society, 2003, pp. 96–105.
APA
RAFI, J., SIMOEN, E., CLAEYS, C., ULYASHIN, A., JOB, R., FAHRNER, W., … CAMPABADAL, F. (2003). Analysis of thermal donor formation in n-type CZ silicon. In B. Kolbesen, C. Claeys, P. Stallhofer, F. Tardif, D. Schroder, T. Shaffner, … P. Rai-Choudhury (Eds.), Analytical and diagnostic techniques for semiconductor materials, devices and processes (pp. 96–105). The Electrochemical Society.
Chicago author-date
RAFI, J, E SIMOEN, C CLAEYS, A ULYASHIN, R JOB, W FAHRNER, Jorg Versluys, Paul Clauws, M LOZANO, and F CAMPABADAL. 2003. “Analysis of Thermal Donor Formation in N-Type CZ Silicon.” In Analytical and Diagnostic Techniques for Semiconductor Materials, Devices and Processes, edited by B Kolbesen, C Claeys, P Stallhofer, F Tardif, D Schroder, T Shaffner, M Tajima, and P Rai-Choudhury, 96–105. The Electrochemical Society.
Chicago author-date (all authors)
RAFI, J, E SIMOEN, C CLAEYS, A ULYASHIN, R JOB, W FAHRNER, Jorg Versluys, Paul Clauws, M LOZANO, and F CAMPABADAL. 2003. “Analysis of Thermal Donor Formation in N-Type CZ Silicon.” In Analytical and Diagnostic Techniques for Semiconductor Materials, Devices and Processes, ed by. B Kolbesen, C Claeys, P Stallhofer, F Tardif, D Schroder, T Shaffner, M Tajima, and P Rai-Choudhury, 96–105. The Electrochemical Society.
Vancouver
1.
RAFI J, SIMOEN E, CLAEYS C, ULYASHIN A, JOB R, FAHRNER W, et al. Analysis of thermal donor formation in n-type CZ silicon. In: Kolbesen B, Claeys C, Stallhofer P, Tardif F, Schroder D, Shaffner T, et al., editors. Analytical and diagnostic techniques for semiconductor materials, devices and processes. The Electrochemical Society; 2003. p. 96–105.
IEEE
[1]
J. RAFI et al., “Analysis of thermal donor formation in n-type CZ silicon,” in Analytical and diagnostic techniques for semiconductor materials, devices and processes, 2003, pp. 96–105.
@inproceedings{218537,
  author       = {{RAFI, J and SIMOEN, E and CLAEYS, C and ULYASHIN, A and JOB, R and FAHRNER, W and Versluys, Jorg and Clauws, Paul and LOZANO, M and CAMPABADAL, F}},
  booktitle    = {{Analytical and diagnostic techniques for semiconductor materials, devices and processes}},
  editor       = {{Kolbesen, B and Claeys, C and Stallhofer, P and Tardif, F and Schroder, D and Shaffner, T and Tajima, M and Rai-Choudhury, P}},
  language     = {{eng}},
  pages        = {{96--105}},
  publisher    = {{The Electrochemical Society}},
  title        = {{Analysis of thermal donor formation in n-type CZ silicon}},
  year         = {{2003}},
}