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Characterisation of oxygen and oxygen-related defects in highly- and lowly-doped silicon

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MLA
SIMEON, E, C CLAEYS, R LOO, et al. “Characterisation of Oxygen and Oxygen-related Defects in Highly- and Lowly-doped Silicon.” MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY 102.1-3 (2003): 207–212. Print.
APA
SIMEON, E., CLAEYS, C., LOO, R., De Gryse, O., Clauws, P., JOB, R., ULYASHIN, A., et al. (2003). Characterisation of oxygen and oxygen-related defects in highly- and lowly-doped silicon. MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY, 102(1-3), 207–212.
Chicago author-date
SIMEON, E, C CLAEYS, R LOO, Olivier De Gryse, Paul Clauws, R JOB, AG ULYASHIN, and W FAHRNER. 2003. “Characterisation of Oxygen and Oxygen-related Defects in Highly- and Lowly-doped Silicon.” Materials Science and Engineering B-solid State Materials for Advanced Technology 102 (1-3): 207–212.
Chicago author-date (all authors)
SIMEON, E, C CLAEYS, R LOO, Olivier De Gryse, Paul Clauws, R JOB, AG ULYASHIN, and W FAHRNER. 2003. “Characterisation of Oxygen and Oxygen-related Defects in Highly- and Lowly-doped Silicon.” Materials Science and Engineering B-solid State Materials for Advanced Technology 102 (1-3): 207–212.
Vancouver
1.
SIMEON E, CLAEYS C, LOO R, De Gryse O, Clauws P, JOB R, et al. Characterisation of oxygen and oxygen-related defects in highly- and lowly-doped silicon. MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY. ELSEVIER SCIENCE SA; 2003;102(1-3):207–12.
IEEE
[1]
E. SIMEON et al., “Characterisation of oxygen and oxygen-related defects in highly- and lowly-doped silicon,” MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY, vol. 102, no. 1–3, pp. 207–212, 2003.
@article{218507,
  author       = {SIMEON, E and CLAEYS, C and LOO, R and De Gryse, Olivier and Clauws, Paul and JOB, R and ULYASHIN, AG and FAHRNER, W},
  issn         = {0921-5107},
  journal      = {MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY},
  language     = {eng},
  number       = {1-3},
  pages        = {207--212},
  publisher    = {ELSEVIER SCIENCE SA},
  title        = {Characterisation of oxygen and oxygen-related defects in highly- and lowly-doped silicon},
  volume       = {102},
  year         = {2003},
}

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