Characterisation of oxygen and oxygen-related defects in highly- and lowly-doped silicon
(2003)
MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY.
102(1-3).
p.207-212
- Author
- E SIMEON, C CLAEYS, R LOO, Olivier De Gryse, Paul Clauws (UGent) , R JOB, AG ULYASHIN and W FAHRNER
- Organization
Citation
Please use this url to cite or link to this publication: http://hdl.handle.net/1854/LU-218507
- MLA
- SIMEON, E., et al. “Characterisation of Oxygen and Oxygen-Related Defects in Highly- and Lowly-Doped Silicon.” MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY, vol. 102, no. 1–3, ELSEVIER SCIENCE SA, 2003, pp. 207–12.
- APA
- SIMEON, E., CLAEYS, C., LOO, R., De Gryse, O., Clauws, P., JOB, R., … FAHRNER, W. (2003). Characterisation of oxygen and oxygen-related defects in highly- and lowly-doped silicon. MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY, 102(1–3), 207–212.
- Chicago author-date
- SIMEON, E, C CLAEYS, R LOO, Olivier De Gryse, Paul Clauws, R JOB, AG ULYASHIN, and W FAHRNER. 2003. “Characterisation of Oxygen and Oxygen-Related Defects in Highly- and Lowly-Doped Silicon.” MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY 102 (1–3): 207–12.
- Chicago author-date (all authors)
- SIMEON, E, C CLAEYS, R LOO, Olivier De Gryse, Paul Clauws, R JOB, AG ULYASHIN, and W FAHRNER. 2003. “Characterisation of Oxygen and Oxygen-Related Defects in Highly- and Lowly-Doped Silicon.” MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY 102 (1–3): 207–212.
- Vancouver
- 1.SIMEON E, CLAEYS C, LOO R, De Gryse O, Clauws P, JOB R, et al. Characterisation of oxygen and oxygen-related defects in highly- and lowly-doped silicon. MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY. 2003;102(1–3):207–12.
- IEEE
- [1]E. SIMEON et al., “Characterisation of oxygen and oxygen-related defects in highly- and lowly-doped silicon,” MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY, vol. 102, no. 1–3, pp. 207–212, 2003.
@article{218507,
author = {{SIMEON, E and CLAEYS, C and LOO, R and De Gryse, Olivier and Clauws, Paul and JOB, R and ULYASHIN, AG and FAHRNER, W}},
issn = {{0921-5107}},
journal = {{MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY}},
language = {{eng}},
number = {{1-3}},
pages = {{207--212}},
publisher = {{ELSEVIER SCIENCE SA}},
title = {{Characterisation of oxygen and oxygen-related defects in highly- and lowly-doped silicon}},
volume = {{102}},
year = {{2003}},
}