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Characterisation of oxygen and oxygen-related defects in highly- and lowly-doped silicon

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MLA
SIMEON, E., et al. “Characterisation of Oxygen and Oxygen-Related Defects in Highly- and Lowly-Doped Silicon.” MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY, vol. 102, no. 1–3, ELSEVIER SCIENCE SA, 2003, pp. 207–12.
APA
SIMEON, E., CLAEYS, C., LOO, R., De Gryse, O., Clauws, P., JOB, R., … FAHRNER, W. (2003). Characterisation of oxygen and oxygen-related defects in highly- and lowly-doped silicon. MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY, 102(1–3), 207–212.
Chicago author-date
SIMEON, E, C CLAEYS, R LOO, Olivier De Gryse, Paul Clauws, R JOB, AG ULYASHIN, and W FAHRNER. 2003. “Characterisation of Oxygen and Oxygen-Related Defects in Highly- and Lowly-Doped Silicon.” MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY 102 (1–3): 207–12.
Chicago author-date (all authors)
SIMEON, E, C CLAEYS, R LOO, Olivier De Gryse, Paul Clauws, R JOB, AG ULYASHIN, and W FAHRNER. 2003. “Characterisation of Oxygen and Oxygen-Related Defects in Highly- and Lowly-Doped Silicon.” MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY 102 (1–3): 207–212.
Vancouver
1.
SIMEON E, CLAEYS C, LOO R, De Gryse O, Clauws P, JOB R, et al. Characterisation of oxygen and oxygen-related defects in highly- and lowly-doped silicon. MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY. 2003;102(1–3):207–12.
IEEE
[1]
E. SIMEON et al., “Characterisation of oxygen and oxygen-related defects in highly- and lowly-doped silicon,” MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY, vol. 102, no. 1–3, pp. 207–212, 2003.
@article{218507,
  author       = {{SIMEON, E and CLAEYS, C and LOO, R and De Gryse, Olivier and Clauws, Paul and JOB, R and ULYASHIN, AG and FAHRNER, W}},
  issn         = {{0921-5107}},
  journal      = {{MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY}},
  language     = {{eng}},
  number       = {{1-3}},
  pages        = {{207--212}},
  publisher    = {{ELSEVIER SCIENCE SA}},
  title        = {{Characterisation of oxygen and oxygen-related defects in highly- and lowly-doped silicon}},
  volume       = {{102}},
  year         = {{2003}},
}

Web of Science
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