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Extended defects in silicon: an old and new story

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Chicago
Vanhellemont, Jan, Olivier De Gryse, and Paul Clauws. 2004. “Extended Defects in Silicon: An Old and New Story.” Gettering and Defect Engineering in Semiconductor Technology 95-96: 263–272.
APA
Vanhellemont, J., De Gryse, O., & Clauws, P. (2004). Extended defects in silicon: an old and new story. GETTERING AND DEFECT ENGINEERING IN SEMICONDUCTOR TECHNOLOGY, 95-96, 263–272.
Vancouver
1.
Vanhellemont J, De Gryse O, Clauws P. Extended defects in silicon: an old and new story. GETTERING AND DEFECT ENGINEERING IN SEMICONDUCTOR TECHNOLOGY. TRANS TECH PUBLICATIONS LTD; 2004;95-96:263–72.
MLA
Vanhellemont, Jan, Olivier De Gryse, and Paul Clauws. “Extended Defects in Silicon: An Old and New Story.” GETTERING AND DEFECT ENGINEERING IN SEMICONDUCTOR TECHNOLOGY 95-96 (2004): 263–272. Print.
@article{218462,
  author       = {Vanhellemont, Jan and De Gryse, Olivier and Clauws, Paul},
  issn         = {1012-0394},
  journal      = {GETTERING AND DEFECT ENGINEERING IN SEMICONDUCTOR TECHNOLOGY},
  language     = {eng},
  pages        = {263--272},
  publisher    = {TRANS TECH PUBLICATIONS LTD},
  title        = {Extended defects in silicon: an old and new story},
  volume       = {95-96},
  year         = {2004},
}

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