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Characterizing the parallax error in multi-pinhole micro-SPECT reconstruction

Bert Vandeghinste UGent, Jan De Beenhouwer UGent, Roel Van Holen UGent, Stefaan Vandenberghe UGent and Steven Staelens UGent (2011) IEEE Nuclear Science Symposium Conference Record. p.2738-2742
abstract
The usage of pinholes is very important in preclinical micro-SPECT. Pinholes can magnify the object onto the detector, resulting in better system resolutions than the detector resolution. The loss in sensitivity is usually countered by adding more pinholes, each projecting onto a specific part of the detector. As a result, gamma rays have an oblique incidence to the detector. This causes displacement and increased uncertainty in the position of the interaction of the gamma ray in the detector, also known as parallax errors or depth-of-interaction (DOI) errors. This in turn has a large influence on image reconstruction algorithms using ray tracers as a forward projector model, as the end-point of each ray on the detector has to be accurately known. In this work, we used GATE to simulate the FLEX Triumph-I system (Gamma Medica-Ideas, Northridge, CA), a CZT-based multi-pinhole micro-SPECT system. This system uses 5 mm thick CZT pixels, with 1.5 mm pixel pitch. The simulated information was then used to enhance the image resolution by accurately modeling the DOI. Two hundred point sources were simulated and rebinned to use the DOI information. This data was then used in a GPU-based iterative reconstruction algorithm taking the simulated DOI into account. The average displacement was then determined for all point sources, and the FWHM was calculated in three dimensions, by fitting the point sources with 3D Gaussians. We show that the displacement is reduced by 83% on average. We also show a 15% resolution gain when only 5 DOI levels are used.
Please use this url to cite or link to this publication:
author
organization
year
type
conference
publication status
published
subject
keyword
Biomedical imaging, Image quality, Detectors
in
IEEE Nuclear Science Symposium Conference Record
issue title
2011 IEEE Nuclear science symposium and medical imaging conference (NSS/MIC)
pages
2738 - 2742
publisher
IEEE
place of publication
Piscataway, NJ, USA
conference name
2011 IEEE Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC 2011)
conference location
Valencia, Spain
conference start
2011-10-23
conference end
2011-10-29
Web of Science type
Proceedings Paper
Web of Science id
000304755602201
ISSN
1082-3654
ISBN
9781467301183
DOI
10.1109/NSSMIC.2011.6152959
project
Ghent researchers on unfolded proteins in inflammatory disease (GROUP-ID)
language
English
UGent publication?
yes
classification
P1
copyright statement
I have transferred the copyright for this publication to the publisher
id
2133004
handle
http://hdl.handle.net/1854/LU-2133004
date created
2012-06-05 14:39:13
date last changed
2013-02-27 09:09:13
@inproceedings{2133004,
  abstract     = {The usage of pinholes is very important in preclinical micro-SPECT. Pinholes can magnify the object onto the detector, resulting in better system resolutions than the detector resolution. The loss in sensitivity is usually countered by adding more pinholes, each projecting onto a specific part of the detector. As a result, gamma rays have an oblique incidence to the detector. This causes displacement and increased uncertainty in the position of the interaction of the gamma ray in the detector, also known as parallax errors or depth-of-interaction (DOI) errors. This in turn has a large influence on image reconstruction algorithms using ray tracers as a forward projector model, as the end-point of each ray on the detector has to be accurately known. In this work, we used GATE to simulate the FLEX Triumph-I system (Gamma Medica-Ideas, Northridge, CA), a CZT-based multi-pinhole micro-SPECT system. This system uses 5 mm thick CZT pixels, with 1.5 mm pixel pitch. The simulated information was then used to enhance the image resolution by accurately modeling the DOI. Two hundred point sources were simulated and rebinned to use the DOI information. This data was then used in a GPU-based iterative reconstruction algorithm taking the simulated DOI into account. The average displacement was then determined for all point sources, and the FWHM was calculated in three dimensions, by fitting the point sources with 3D Gaussians. We show that the displacement is reduced by 83\% on average. We also show a 15\% resolution gain when only 5 DOI levels are used.},
  author       = {Vandeghinste, Bert and De Beenhouwer, Jan and Van Holen, Roel and Vandenberghe, Stefaan and Staelens, Steven},
  booktitle    = {IEEE Nuclear Science Symposium Conference Record},
  isbn         = {9781467301183},
  issn         = {1082-3654},
  keyword      = {Biomedical imaging,Image quality,Detectors},
  language     = {eng},
  location     = {Valencia, Spain},
  pages        = {2738--2742},
  publisher    = {IEEE},
  title        = {Characterizing the parallax error in multi-pinhole micro-SPECT reconstruction},
  url          = {http://dx.doi.org/10.1109/NSSMIC.2011.6152959},
  year         = {2011},
}

Chicago
Vandeghinste, Bert, Jan De Beenhouwer, Roel Van Holen, Stefaan Vandenberghe, and Steven Staelens. 2011. “Characterizing the Parallax Error in Multi-pinhole micro-SPECT Reconstruction.” In IEEE Nuclear Science Symposium Conference Record, 2738–2742. Piscataway, NJ, USA: IEEE.
APA
Vandeghinste, B., De Beenhouwer, J., Van Holen, R., Vandenberghe, S., & Staelens, S. (2011). Characterizing the parallax error in multi-pinhole micro-SPECT reconstruction. IEEE Nuclear Science Symposium Conference Record (pp. 2738–2742). Presented at the 2011 IEEE Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC 2011), Piscataway, NJ, USA: IEEE.
Vancouver
1.
Vandeghinste B, De Beenhouwer J, Van Holen R, Vandenberghe S, Staelens S. Characterizing the parallax error in multi-pinhole micro-SPECT reconstruction. IEEE Nuclear Science Symposium Conference Record. Piscataway, NJ, USA: IEEE; 2011. p. 2738–42.
MLA
Vandeghinste, Bert, Jan De Beenhouwer, Roel Van Holen, et al. “Characterizing the Parallax Error in Multi-pinhole micro-SPECT Reconstruction.” IEEE Nuclear Science Symposium Conference Record. Piscataway, NJ, USA: IEEE, 2011. 2738–2742. Print.