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Characterization of deep defects in CdS/CdTe thin film solar cells using deep level transient spectroscopy

(2004) THIN SOLID FILMS. 451-52. p.434-438
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Chicago
Versluys, Jorg, R CLAUWS, Peter Nollet, Stefaan Degrave, and Marc Burgelman. 2004. “Characterization of Deep Defects in CdS/CdTe Thin Film Solar Cells Using Deep Level Transient Spectroscopy.” Thin Solid Films 451-52: 434–438.
APA
Versluys, Jorg, CLAUWS, R., Nollet, P., Degrave, S., & Burgelman, M. (2004). Characterization of deep defects in CdS/CdTe thin film solar cells using deep level transient spectroscopy. THIN SOLID FILMS, 451-52, 434–438.
Vancouver
1.
Versluys J, CLAUWS R, Nollet P, Degrave S, Burgelman M. Characterization of deep defects in CdS/CdTe thin film solar cells using deep level transient spectroscopy. THIN SOLID FILMS. ELSEVIER SCIENCE SA; 2004;451-52:434–8.
MLA
Versluys, Jorg, R CLAUWS, Peter Nollet, et al. “Characterization of Deep Defects in CdS/CdTe Thin Film Solar Cells Using Deep Level Transient Spectroscopy.” THIN SOLID FILMS 451-52 (2004): 434–438. Print.
@article{213019,
  author       = {Versluys, Jorg and CLAUWS, R and Nollet, Peter and Degrave, Stefaan and Burgelman, Marc},
  issn         = {0040-6090},
  journal      = {THIN SOLID FILMS},
  language     = {eng},
  pages        = {434--438},
  publisher    = {ELSEVIER SCIENCE SA},
  title        = {Characterization of deep defects in CdS/CdTe thin film solar cells using deep level transient spectroscopy},
  volume       = {451-52},
  year         = {2004},
}

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