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DLTS and admittance measurements on CdS/CdTe solar cells

(2003) THIN SOLID FILMS. 431. p.148-152
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Chicago
Versluys, Jorg, Paul Clauws, Peter Nollet, Stefaan Degrave, and Marc Burgelman. 2003. “DLTS and Admittance Measurements on CdS/CdTe Solar Cells.” Thin Solid Films 431: 148–152.
APA
Versluys, Jorg, Clauws, P., Nollet, P., Degrave, S., & Burgelman, M. (2003). DLTS and admittance measurements on CdS/CdTe solar cells. THIN SOLID FILMS, 431, 148–152.
Vancouver
1.
Versluys J, Clauws P, Nollet P, Degrave S, Burgelman M. DLTS and admittance measurements on CdS/CdTe solar cells. THIN SOLID FILMS. 2003;431:148–52.
MLA
Versluys, Jorg, Paul Clauws, Peter Nollet, et al. “DLTS and Admittance Measurements on CdS/CdTe Solar Cells.” THIN SOLID FILMS 431 (2003): 148–152. Print.
@article{210147,
  author       = {Versluys, Jorg and Clauws, Paul and Nollet, Peter and Degrave, Stefaan and Burgelman, Marc},
  issn         = {0040-6090},
  journal      = {THIN SOLID FILMS},
  language     = {eng},
  pages        = {148--152},
  title        = {DLTS and admittance measurements on CdS/CdTe solar cells},
  volume       = {431},
  year         = {2003},
}

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