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X-ray photoelectron spectroscopy (XPS) depth profiling for evaluation of La2Zr2O7 buffer layer capacity

Narayanan Vyshnavi UGent, Klaartje De Buysser UGent, Els Bruneel UGent and Isabel Van Driessche UGent (2012) MATERIALS. 5(3). p.364-376
abstract
Lanthanum zirconate (LZO) films from water-based precursors were deposited on Ni-5% W tape by chemical solution deposition. The buffer capacity of these layers includes the prevention of Ni oxidation of the substrate and Ni penetration towards the YBCO film which is detrimental for the superconducting properties. X-ray Photoelectron Spectroscopy depth profiling was used to study the barrier efficiency before and after an additional oxygen annealing step, which simulates the thermal treatment for YBCO thin film synthesis. Measurements revealed that the thermal treatment in presence of oxygen could severely increase Ni diffusion. Nonetheless it was shown that from the water-based precursors' buffer layers with sufficient barrier capacity towards Ni penetration could be synthesized if the layers meet a certain critical thickness and density.
Please use this url to cite or link to this publication:
author
organization
year
type
journalArticle (original)
publication status
published
subject
keyword
CHEMICAL SOLUTION DEPOSITION, EPITAXIAL-GROWTH, YBCO-COATED CONDUCTORS, X-ray photoelectron spectroscopy, depth profile, buffer layers, coated conductor, chemical solution deposition, THIN-FILMS, RABITS, TAPES
journal title
MATERIALS
Materials
volume
5
issue
3
pages
364 - 376
Web of Science type
Article
Web of Science id
000302135800001
JCR category
MATERIALS SCIENCE, MULTIDISCIPLINARY
JCR impact factor
2.247 (2012)
JCR rank
54/239 (2012)
JCR quartile
1 (2012)
ISSN
1996-1944
DOI
10.3390/ma5030364
language
English
UGent publication?
yes
classification
A1
copyright statement
I have retained and own the full copyright for this publication
id
2091536
handle
http://hdl.handle.net/1854/LU-2091536
date created
2012-04-19 14:29:57
date last changed
2012-05-10 10:10:38
@article{2091536,
  abstract     = {Lanthanum zirconate (LZO) films from water-based precursors were deposited on Ni-5\% W tape by chemical solution deposition. The buffer capacity of these layers includes the prevention of Ni oxidation of the substrate and Ni penetration towards the YBCO film which is detrimental for the superconducting properties. X-ray Photoelectron Spectroscopy depth profiling was used to study the barrier efficiency before and after an additional oxygen annealing step, which simulates the thermal treatment for YBCO thin film synthesis. Measurements revealed that the thermal treatment in presence of oxygen could severely increase Ni diffusion. Nonetheless it was shown that from the water-based precursors' buffer layers with sufficient barrier capacity towards Ni penetration could be synthesized if the layers meet a certain critical thickness and density.},
  author       = {Vyshnavi, Narayanan and De Buysser, Klaartje and Bruneel, Els and Van Driessche, Isabel},
  issn         = {1996-1944},
  journal      = {MATERIALS},
  keyword      = {CHEMICAL SOLUTION DEPOSITION,EPITAXIAL-GROWTH,YBCO-COATED CONDUCTORS,X-ray photoelectron spectroscopy,depth profile,buffer layers,coated conductor,chemical solution deposition,THIN-FILMS,RABITS,TAPES},
  language     = {eng},
  number       = {3},
  pages        = {364--376},
  title        = {X-ray photoelectron spectroscopy (XPS) depth profiling for evaluation of La2Zr2O7 buffer layer capacity},
  url          = {http://dx.doi.org/10.3390/ma5030364},
  volume       = {5},
  year         = {2012},
}

Chicago
Vyshnavi, Narayanan, Klaartje De Buysser, Els Bruneel, and Isabel Van Driessche. 2012. “X-ray Photoelectron Spectroscopy (XPS) Depth Profiling for Evaluation of La2Zr2O7 Buffer Layer Capacity.” Materials 5 (3): 364–376.
APA
Vyshnavi, N., De Buysser, K., Bruneel, E., & Van Driessche, I. (2012). X-ray photoelectron spectroscopy (XPS) depth profiling for evaluation of La2Zr2O7 buffer layer capacity. MATERIALS, 5(3), 364–376.
Vancouver
1.
Vyshnavi N, De Buysser K, Bruneel E, Van Driessche I. X-ray photoelectron spectroscopy (XPS) depth profiling for evaluation of La2Zr2O7 buffer layer capacity. MATERIALS. 2012;5(3):364–76.
MLA
Vyshnavi, Narayanan, Klaartje De Buysser, Els Bruneel, et al. “X-ray Photoelectron Spectroscopy (XPS) Depth Profiling for Evaluation of La2Zr2O7 Buffer Layer Capacity.” MATERIALS 5.3 (2012): 364–376. Print.